Chemical depth profile of passive oxide on stainless steel

被引：14

作者：

Kim, DH ^{[1
]}

Lee, HH

Kim, SS

Kang, HC

Noh, DY

Kim, H

Sinha, SK

机构：

[1] Gwangju Inst Sci & Technol, Dept Mat Sci & Engn, Kwangju 500712, South Korea

[2] Sogang Univ, Dept Phys, Seoul 121742, South Korea

[3] Univ Calif San Diego, Dept Phys, San Diego, CA 92093 USA

来源：

APPLIED PHYSICS LETTERS | 2004年 / 85卷 / 26期

关键词：

D O I：

10.1063/1.1842362

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The chemical depth profile of the passive oxides formed on a stainless-steel surface (type 430, Fe-16.3%Cr) in pH 8.4 borate solution was obtained quantitatively by in situ anomalous x-ray reflectivity. The passive film consists of a Cr oxide inner layer and a Fe/Cr oxide outer layer. The absence of Fe oxide underneath Cr oxide indicates that Cr oxide provides the passivity in stainless steel by inhibiting oxygen anion diffusion. The oxide grows by limited metallic cation transfer. The passivity breaks down in transpassive regime due to the oxidation of the Cr oxide to a soluble oxide. (C) 2004 American Institute of Physics.

引用

页码：6427 / 6429

页数：3

共 14 条

[1]

Als-Nielsen J., 1994, Physics Reports, V246, P251, DOI 10.1016/0370-1573(94)90046-9

[2] RESONANT X-RAY REFLECTIVITY MEASUREMENTS OF A NI/FE ALLOY THIN-FILM - A COMPOSITION PROFILE [J].

BAI, J ;

TOMKIEWICZ, M ;

MONTANO, PA .

ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER, 1995, 97 (03) :465-472

[3] EXSITU SURFACE-ANALYSIS OF PASSIVE FILMS ON FE-CR ALLOYS - WHEN IS IT VALID [J].

BARDWELL, JA ;

SPROULE, GI ;

GRAHAM, MJ .

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1993, 140 (01) :50-53

[4] Determination of absolute indium content in InGaN/GaN multiple quantum wells using anomalous x-ray scattering [J].

Lee, HH ;

Yi, MS ;

Jang, HW ;

Moon, YT ;

Park, SJ ;

Noh, DY ;

Tang, M ;

Liang, KS .

APPLIED PHYSICS LETTERS, 2002, 81 (27) :5120-5122

[5]

MATERLIK G, 1994, RESONANT ANOMALOUS X, P421

[6] THE CHEMICAL-COMPOSITION OF THE PASSIVE FILM ON FE-24CR AND FE-24CR-11MO STUDIED BY AES, XPS AND SIMS [J].

MISCHLER, S ;

VOGEL, A ;

MATHIEU, HJ ;

LANDOLT, D .

CORROSION SCIENCE, 1991, 32 (09) :925-944

[7] In situ determination of the composition of surface films formed on Fe-Cr alloys [J].

Oblonsky, LJ ;

Ryan, MP ;

Isaacs, HS .

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1998, 145 (06) :1922-1932

[8] SURFACE STUDIES OF SOLIDS BY TOTAL REFLECTION OF X-RAYS [J].

PARRATT, LG .

PHYSICAL REVIEW, 1954, 95 (02) :359-369

[9] Spectroelectrochemical studies of passivation and transpassive breakdown reactions of stainless steel [J].

Piao, T ;

Park, SM .

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1997, 144 (10) :3371-3377

[10] Transpassive dissolution of Cr and sputter-deposited Cr oxides studied by in situ x-ray near-edge spectroscopy [J].

Schmuki, P ;

Virtanen, S ;

Davenport, AJ ;

Vitus, CM .

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1996, 143 (12) :3997-4005

← 1 2 →