Direct separation of short range order in intermixed nanocrystalline and amorphous phases

被引：35

作者：

Frenkel, AI ^{[1
]}

Kolobov, AV

Robinson, IK

Cross, JO

Maeda, Y

Bouldin, CE

机构：

[1] Yeshiva Univ, Dept Phys, New York, NY 10016 USA

[2] Natl Inst Adv Ind Sci & Technol, Joint Res Ctr Atom Technol, Tsukuba, Ibaraki 3058562, Japan

[3] Natl Inst Adv Ind Sci & Technol, Lab Adv Opt Technol, Tsukuba, Ibaraki 3058562, Japan

[4] Univ Illinois, Dept Phys, Loomis Lab, Urbana, IL 61801 USA

[5] Argonne Natl Lab, PNCCAT, Argonne, IL 60439 USA

[6] Univ Osaka Prefecture, Osaka 5998531, Japan

[7] Natl Inst Stand & Technol, Div Ceram, Gaithersburg, MD 20899 USA

来源：

PHYSICAL REVIEW LETTERS | 2002年 / 89卷 / 28期

关键词：

D O I：

10.1103/PhysRevLett.89.285503

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Diffraction anomalous fine-structure (DAFS) and extended x-ray absorption fine-structure (EXAFS) measurements were combined to determine short range order (SRO) about a single atomic type in a sample of mixed amorphous and nanocrystalline phases of germanium. EXAFS yields information about the SRO of all Ge atoms in the sample, while DAFS determines the SRO of only the ordered fraction. We determine that the first-shell distance distribution is bimodal; the nanocrystalline distance is the same as the bulk crystal, to within 0.01(2) Angstrom, but the mean amorphous Ge-Ge bond length is expanded by 0.076(19) Angstrom. This approach can be applied to many systems of mixed amorphous and nanocrystalline phases.

引用

页数：4

共 18 条

[1] Real-space multiple-scattering calculation and interpretation of x-ray-absorption near-edge structure [J].