Double conical crystal x-ray spectrometer for high resolution ultrafast x-ray absorption near-edge spectroscopy of Al K edge

被引：22

作者：

Levy, A. ^{[1
]}

Dorchies, F. ^{[1
]}

Fourment, C. ^{[1
]}

Harmand, M. ^{[1
]}

Hulin, S. ^{[1
]}

Santos, J. J. ^{[1
]}

Descamps, D. ^{[1
]}

Petit, S. ^{[1
]}

Bouillaud, R. ^{[1
]}

机构：

[1] Univ Bordeaux, CEA, CNRS, Ctr Lasers Intenses & Applicat, F-33405 Talence, France

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2010年 / 81卷 / 06期

关键词：

D O I：

10.1063/1.3441983

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

An x-ray spectrometer devoted to dynamical studies of transient systems using the x-ray absorption fine spectroscopy technique is presented in this article. Using an ultrafast laser-induced x-ray source, this optical device based on a set of two potassium acid phthalate conical crystals allows the extraction of x-ray absorption near-edge spectroscopy structures following the Al absorption K edge. The proposed experimental protocol leads to a measurement of the absorption spectra free from any crystal reflectivity defaults and shot-to-shot x-ray spectral fluctuation. According to the detailed analysis of the experimental results, a spectral resolution of 0.7 eV rms and relative fluctuation lower than 1% rms are achieved, demonstrated to be limited by the statistics of photon counting on the x-ray detector. CD 2010 American Institute of Physics. [doi:10.1063/1.3441983]

引用

页数：5

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