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- [1] Prediction of highly scaled hydrogen-terminated diamond MISFET performance based on calibrated TCAD simulationDIAMOND AND RELATED MATERIALS, 2017, 80 : 14 - 17Wong, Hiu Yung论文数: 0 引用数: 0 h-index: 0机构: Synopsys Inc, Mountain View, CA 94043 USA Synopsys Inc, Mountain View, CA 94043 USABraga, Nelson论文数: 0 引用数: 0 h-index: 0机构: Synopsys Inc, Mountain View, CA 94043 USA Synopsys Inc, Mountain View, CA 94043 USAMickevicius, R. V.论文数: 0 引用数: 0 h-index: 0机构: Synopsys Inc, Mountain View, CA 94043 USA Synopsys Inc, Mountain View, CA 94043 USA
- [2] Electronic images of hydrogen-terminated diamond(111) surfacesSURFACE SCIENCE, 1996, 364 (02) : 141 - 150Zheng, XM论文数: 0 引用数: 0 h-index: 0机构: Dept. of Phys. and Theor. Chemistry, University of Sydney, Sydney
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- [4] Photoelectric characteristics of hydrogen-terminated polycrystalline diamond MESFETsOPTICS EXPRESS, 2023, 31 (18) : 29061 - 29073Liu, Yuebo论文数: 0 引用数: 0 h-index: 0机构: China Elect Prod Reliabil & Environm Testing Res, Guangzhou 511370, Peoples R China China Elect Prod Reliabil & Environm Testing Res, Guangzhou 511370, Peoples R ChinaDong, Xianshan论文数: 0 引用数: 0 h-index: 0机构: China Elect Prod Reliabil & Environm Testing Res, Guangzhou 511370, Peoples R China China Elect Prod Reliabil & Environm Testing Res, Guangzhou 511370, Peoples R ChinaLiao, Wenyuan论文数: 0 引用数: 0 h-index: 0机构: China Elect Prod Reliabil & Environm Testing Res, Guangzhou 511370, Peoples R China China Elect Prod Reliabil & Environm Testing Res, Guangzhou 511370, Peoples R ChinaYan, Jiahui论文数: 0 引用数: 0 h-index: 0机构: China Elect Prod Reliabil & Environm Testing Res, Guangzhou 511370, Peoples R China China Elect Prod Reliabil & Environm Testing Res, Guangzhou 511370, Peoples R ChinaNiu, Hao论文数: 0 引用数: 0 h-index: 0机构: China Elect Prod Reliabil & Environm Testing Res, Guangzhou 511370, Peoples R China China Elect Prod Reliabil & Environm Testing Res, Guangzhou 511370, Peoples R ChinaDai, Zongbei论文数: 0 引用数: 0 h-index: 0机构: China Elect Prod Reliabil & Environm Testing Res, Guangzhou 511370, Peoples R China China Elect Prod Reliabil & Environm Testing Res, Guangzhou 511370, Peoples R ChinaLai, Canxiong论文数: 0 引用数: 0 h-index: 0机构: China Elect Prod Reliabil & Environm Testing Res, Guangzhou 511370, Peoples R China China Elect Prod Reliabil & Environm Testing Res, Guangzhou 511370, Peoples R ChinaYang, Xiaofeng论文数: 0 引用数: 0 h-index: 0机构: China Elect Prod Reliabil & Environm Testing Res, Guangzhou 511370, Peoples R China China Elect Prod Reliabil & Environm Testing Res, Guangzhou 511370, Peoples R ChinaYang, Shaohua论文数: 0 引用数: 0 h-index: 0机构: China Elect Prod Reliabil & Environm Testing Res, Guangzhou 511370, Peoples R China China Elect Prod Reliabil & Environm Testing Res, Guangzhou 511370, Peoples R ChinaLv, Zesheng论文数: 0 引用数: 0 h-index: 0机构: Sun Yat Sen Univ, Sch Elect & Informat Technol, Guangzhou 510006, Peoples R China China Elect Prod Reliabil & Environm Testing Res, Guangzhou 511370, Peoples R ChinaXu, Mingsheng论文数: 0 引用数: 0 h-index: 0机构: Shandong Univ, Inst Novel Semicond Mat, Jinan 250100, Peoples R China Shandong Univ, State Key Lab Crystal Mat, Jinan 250100, Peoples R China China Elect Prod Reliabil & Environm Testing Res, Guangzhou 511370, Peoples R ChinaWang, Hongyue论文数: 0 引用数: 0 h-index: 0机构: China Elect Prod Reliabil & Environm Testing Res, Guangzhou 511370, Peoples R China China Elect Prod Reliabil & Environm Testing Res, Guangzhou 511370, Peoples R China
- [5] Physical-Based Simulation of DC Characteristics of Hydrogen-Terminated Diamond MOSFETs2017 IEEE ELECTRICAL DESIGN OF ADVANCED PACKAGING AND SYSTEMS SYMPOSIUM (EDAPS), 2017,Fu, Yu论文数: 0 引用数: 0 h-index: 0机构: UESTC, Sch Elect Engn, Chengdu, Sichuan, Peoples R China UESTC, Sch Elect Engn, Chengdu, Sichuan, Peoples R ChinaXu, Yuehang论文数: 0 引用数: 0 h-index: 0机构: UESTC, Sch Elect Engn, Chengdu, Sichuan, Peoples R China UESTC, Sch Elect Engn, Chengdu, Sichuan, Peoples R ChinaXu, Ruimin论文数: 0 引用数: 0 h-index: 0机构: UESTC, Sch Elect Engn, Chengdu, Sichuan, Peoples R China UESTC, Sch Elect Engn, Chengdu, Sichuan, Peoples R ChinaZhou, Jianjun论文数: 0 引用数: 0 h-index: 0机构: Nanjing Elect Devices Inst, Key Lab Integrated Circuits, Nanjing, Jiangsu, Peoples R China UESTC, Sch Elect Engn, Chengdu, Sichuan, Peoples R ChinaKong, Yuechan论文数: 0 引用数: 0 h-index: 0机构: Nanjing Elect Devices Inst, Key Lab Integrated Circuits, Nanjing, Jiangsu, Peoples R China UESTC, Sch Elect Engn, Chengdu, Sichuan, Peoples R China
- [6] Numerical Investigation of Laterally Downscaled Hydrogen-Terminated Diamond FETsIEEE TRANSACTIONS ON ELECTRON DEVICES, 2023, 70 (01) : 20 - 24Chen, Junfei论文数: 0 引用数: 0 h-index: 0机构: Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R China Xidian Wuhu Res Inst, Wuhu 241002, Peoples R China Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R ChinaWu, Yong论文数: 0 引用数: 0 h-index: 0机构: Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R China Xidian Wuhu Res Inst, Wuhu 241002, Peoples R China Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R ChinaZhang, Jinfeng论文数: 0 引用数: 0 h-index: 0机构: Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R China Xidian Wuhu Res Inst, Wuhu 241002, Peoples R China Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R ChinaWang, Dong论文数: 0 引用数: 0 h-index: 0机构: Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R China Xidian Wuhu Res Inst, Wuhu 241002, Peoples R China Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R ChinaRen, Zeyang论文数: 0 引用数: 0 h-index: 0机构: Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R China Xidian Wuhu Res Inst, Wuhu 241002, Peoples R China Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R ChinaChen, Xing论文数: 0 引用数: 0 h-index: 0机构: Xidian Wuhu Res Inst, Wuhu 241002, Peoples R China Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R ChinaLei, Yingyi论文数: 0 引用数: 0 h-index: 0机构: Xian Microelect Technol Inst, Xian 710054, Peoples R China Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R ChinaZhang, Jincheng论文数: 0 引用数: 0 h-index: 0机构: Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R China Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R ChinaHao, Yue论文数: 0 引用数: 0 h-index: 0机构: Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R China Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R China
- [7] Time-dependent degradation of hydrogen-terminated diamond MESFETsTERAHERTZ, RF, MILLIMETER, AND SUBMILLIMETER-WAVE TECHNOLOGY AND APPLICATIONS XV, 2022, 12000论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:Veron, C.论文数: 0 引用数: 0 h-index: 0机构: Univ Roma Tor Vergata, Dept Ind Engn, I-00133 Rome, Italy Univ Padua, Dept Informat Engn, I-35131 Padua, ItalyRinati, G. Verona论文数: 0 引用数: 0 h-index: 0机构: Univ Roma Tor Vergata, Dept Ind Engn, I-00133 Rome, Italy Univ Padua, Dept Informat Engn, I-35131 Padua, ItalyCannata, D.论文数: 0 引用数: 0 h-index: 0机构: Inst Microelect & Microsyst IMM CNR, I-00133 Rome, Italy Univ Padua, Dept Informat Engn, I-35131 Padua, Italy论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:Meneghini, M.论文数: 0 引用数: 0 h-index: 0机构: Univ Padua, Dept Informat Engn, I-35131 Padua, Italy Univ Padua, Dept Informat Engn, I-35131 Padua, Italy
- [8] Ohmic Contact of Pt/Au on Hydrogen-Terminated Single Crystal DiamondCOATINGS, 2019, 9 (09)Zhang, Minghui论文数: 0 引用数: 0 h-index: 0机构: Xi An Jiao Tong Univ, Key Lab Phys Elect & Devices, Minist Educ, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Sch Elect & Informat Engn, Inst Wide Band Gap Semicond, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Key Lab Phys Elect & Devices, Minist Educ, Xian 710049, Shaanxi, Peoples R ChinaLin, Fang论文数: 0 引用数: 0 h-index: 0机构: Xi An Jiao Tong Univ, Key Lab Phys Elect & Devices, Minist Educ, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Sch Elect & Informat Engn, Inst Wide Band Gap Semicond, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Key Lab Phys Elect & Devices, Minist Educ, Xian 710049, Shaanxi, Peoples R ChinaWang, Wei论文数: 0 引用数: 0 h-index: 0机构: Xi An Jiao Tong Univ, Key Lab Phys Elect & Devices, Minist Educ, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Sch Elect & Informat Engn, Inst Wide Band Gap Semicond, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Key Lab Phys Elect & Devices, Minist Educ, Xian 710049, Shaanxi, Peoples R ChinaLi, Fengnan论文数: 0 引用数: 0 h-index: 0机构: Xi An Jiao Tong Univ, Key Lab Phys Elect & Devices, Minist Educ, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Sch Elect & Informat Engn, Inst Wide Band Gap Semicond, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Key Lab Phys Elect & Devices, Minist Educ, Xian 710049, Shaanxi, Peoples R ChinaWang, Yan-Feng论文数: 0 引用数: 0 h-index: 0机构: Xi An Jiao Tong Univ, Key Lab Phys Elect & Devices, Minist Educ, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Sch Elect & Informat Engn, Inst Wide Band Gap Semicond, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Key Lab Phys Elect & Devices, Minist Educ, Xian 710049, Shaanxi, Peoples R ChinaAbbasi, Haris Naeem论文数: 0 引用数: 0 h-index: 0机构: Xi An Jiao Tong Univ, Key Lab Phys Elect & Devices, Minist Educ, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Sch Elect & Informat Engn, Inst Wide Band Gap Semicond, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Key Lab Phys Elect & Devices, Minist Educ, Xian 710049, Shaanxi, Peoples R ChinaZhao, Dan论文数: 0 引用数: 0 h-index: 0机构: Xi An Jiao Tong Univ, Key Lab Phys Elect & Devices, Minist Educ, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Sch Elect & Informat Engn, Inst Wide Band Gap Semicond, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Key Lab Phys Elect & Devices, Minist Educ, Xian 710049, Shaanxi, Peoples R ChinaChen, Genqiang论文数: 0 引用数: 0 h-index: 0机构: Xi An Jiao Tong Univ, Key Lab Phys Elect & Devices, Minist Educ, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Sch Elect & Informat Engn, Inst Wide Band Gap Semicond, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Key Lab Phys Elect & Devices, Minist Educ, Xian 710049, Shaanxi, Peoples R ChinaWen, Feng论文数: 0 引用数: 0 h-index: 0机构: Xi An Jiao Tong Univ, Key Lab Phys Elect & Devices, Minist Educ, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Sch Elect & Informat Engn, Inst Wide Band Gap Semicond, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Key Lab Phys Elect & Devices, Minist Educ, Xian 710049, Shaanxi, Peoples R ChinaZhang, Jingwen论文数: 0 引用数: 0 h-index: 0机构: Xi An Jiao Tong Univ, Key Lab Phys Elect & Devices, Minist Educ, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Sch Elect & Informat Engn, Inst Wide Band Gap Semicond, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Key Lab Phys Elect & Devices, Minist Educ, Xian 710049, Shaanxi, Peoples R ChinaBu, Renan论文数: 0 引用数: 0 h-index: 0机构: Xi An Jiao Tong Univ, Key Lab Phys Elect & Devices, Minist Educ, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Sch Elect & Informat Engn, Inst Wide Band Gap Semicond, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Key Lab Phys Elect & Devices, Minist Educ, Xian 710049, Shaanxi, Peoples R ChinaWang, Hongxing论文数: 0 引用数: 0 h-index: 0机构: Xi An Jiao Tong Univ, Key Lab Phys Elect & Devices, Minist Educ, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Sch Elect & Informat Engn, Inst Wide Band Gap Semicond, Xian 710049, Shaanxi, Peoples R China Xi An Jiao Tong Univ, Key Lab Phys Elect & Devices, Minist Educ, Xian 710049, Shaanxi, Peoples R China
- [9] Identification of Defects and the Origins of Surface Noise on Hydrogen-Terminated (100) DiamondADVANCED MATERIALS INTERFACES, 2025, 12 (06):Sung, Yi-Ying论文数: 0 引用数: 0 h-index: 0机构: La Trobe Univ, Dept Math & Phys Sci, Bundoora, Vic 3086, Australia La Trobe Univ, Dept Math & Phys Sci, Bundoora, Vic 3086, AustraliaOberg, Lachlan论文数: 0 引用数: 0 h-index: 0机构: Australian Natl Univ, Canberra, ACT 2600, Australia La Trobe Univ, Dept Math & Phys Sci, Bundoora, Vic 3086, AustraliaGriffin, Rebecca论文数: 0 引用数: 0 h-index: 0机构: La Trobe Univ, Dept Math & Phys Sci, Bundoora, Vic 3086, Australia La Trobe Univ, Dept Math & Phys Sci, Bundoora, Vic 3086, AustraliaSchenk, Alex K.论文数: 0 引用数: 0 h-index: 0机构: La Trobe Univ, Dept Math & Phys Sci, Bundoora, Vic 3086, Australia La Trobe Univ, Dept Math & Phys Sci, Bundoora, Vic 3086, AustraliaChandler, Henry论文数: 0 引用数: 0 h-index: 0机构: Quantum Brilliance Pty Ltd, 60 Mills Rd, Acton, ACT 2601, Australia La Trobe Univ, Dept Math & Phys Sci, Bundoora, Vic 3086, AustraliaGallo, Santiago Corujeira论文数: 0 引用数: 0 h-index: 0机构: Quantum Brilliance Pty Ltd, 60 Mills Rd, Acton, ACT 2601, Australia La Trobe Univ, Dept Math & Phys Sci, Bundoora, Vic 3086, Australia论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:
- [10] Hydrogen-terminated diamond MOSFETs on (001) single crystal diamond with state of the art high RF power densityFUNCTIONAL DIAMOND, 2022, 2 (01): : 64 - 70Yu, Cui论文数: 0 引用数: 0 h-index: 0机构: Hebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang, Peoples R China Hebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang, Peoples R ChinaZhou, Chuangjie论文数: 0 引用数: 0 h-index: 0机构: Hebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang, Peoples R China Hebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang, Peoples R ChinaGuo, Jianchao论文数: 0 引用数: 0 h-index: 0机构: Hebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang, Peoples R China Hebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang, Peoples R ChinaHe, Zezhao论文数: 0 引用数: 0 h-index: 0机构: Hebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang, Peoples R China Hebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang, Peoples R ChinaMa, Mengyu论文数: 0 引用数: 0 h-index: 0机构: Hebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang, Peoples R China Hebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang, Peoples R ChinaYu, Hao论文数: 0 引用数: 0 h-index: 0机构: Hebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang, Peoples R China Hebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang, Peoples R ChinaSong, Xubo论文数: 0 引用数: 0 h-index: 0机构: Hebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang, Peoples R China Hebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang, Peoples R ChinaBu, Aimin论文数: 0 引用数: 0 h-index: 0机构: Hebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang, Peoples R China Hebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang, Peoples R ChinaFeng, Zhihong论文数: 0 引用数: 0 h-index: 0机构: Hebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang, Peoples R China Hebei Semicond Res Inst, Natl Key Lab ASIC, Shijiazhuang, Peoples R China