Near-field scanning tunnelling optical microscope

被引：0

作者：

Papayan, GV ^{[1
]}

Voronin, YM ^{[1
]}

Shchetnev, YF ^{[1
]}

Kichenko, EV ^{[1
]}

机构：

[1] SI Vavilov State Opt Inst, All Russia Sci Ctr, St Petersburg, Russia

来源：

JOURNAL OF OPTICAL TECHNOLOGY | 1997年 / 64卷 / 12期

关键词：

D O I：

暂无

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

This paper describes the optical system and the main elements of a prototype of a near-field scanning optical microscope, based on the use of the tunneling effect of light from a sample into a point lightguide using total internal reflection. A personal computer is used to control the displacement of an insulating point by means of a three-coordinate piezoceramic manipulator and to record the image. A He-Ne laser is used as the light source. Topographic images of the surface microstructure of transparent samples are obtained with a resolution of 0.1 lambda in the plane of the sample and 0.002 lambda in height. (C) 1997 The Optical Society of America. [S1070-9762(97)01212-8].

引用

页码：1147 / 1150

页数：4

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