Evaluation for intra-word faults in word-oriented RAMs

被引：0

作者：

Hamdioui, S ^{[1
]}

Reyes, JD ^{[1
]}

Al-ars, Z ^{[1
]}

机构：

[1] Delft Univ Technol, CE Lab, NL-2628 CD Delft, Netherlands

来源：

13TH ASIAN TEST SYMPOSIUM, PROCEEDINGS | 2004年

关键词：

D O I：

10.1109/ATS.2004.42

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

This paper presents an industrial evaluation of tests for intra-word faults in word oriented memories, applied to big arrays with bit-interleaved organization as well as to small arrays with bit-adjacent organization, in order to investigate the influence of the memory organization on the intra-word faults. The test results show that the intra-word faults are also significantly important for interleaved memories, even though that the cells within a single word are not physically adjacent.

引用

页码：283 / 288

页数：6

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