Evaluation for intra-word faults in word-oriented RAMs

被引：0
|
作者：
Hamdioui, S [1 ]
Reyes, JD [1 ]
Al-ars, Z [1 ]
机构：
[1] Delft Univ Technol, CE Lab, NL-2628 CD Delft, Netherlands
来源：
13TH ASIAN TEST SYMPOSIUM, PROCEEDINGS | 2004年
关键词：
D O I：
10.1109/ATS.2004.42
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
This paper presents an industrial evaluation of tests for intra-word faults in word oriented memories, applied to big arrays with bit-interleaved organization as well as to small arrays with bit-adjacent organization, in order to investigate the influence of the memory organization on the intra-word faults. The test results show that the intra-word faults are also significantly important for interleaved memories, even though that the cells within a single word are not physically adjacent.
引用
收藏
页码：283 / 288
页数：6
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