Reflective second harmonic generation from ZnO thin films: A study on the Zn-O bonding

被引:24
作者
Lo, Kuang Yao
Huang, Yi Jen
Huang, Jung Y.
Feng, Zhe Chuan [1 ]
机构
[1] Natl Taiwan Univ, Grad Inst Electroopt Engn, Taipei 106, Taiwan
[2] Natl Taiwan Univ, Dept Elect Engn, Taipei 106, Taiwan
[3] Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA
[4] Natl Chiao Tung Univ, Dept Photon, Hsinchu 300, Taiwan
[5] Natl Chiayi Univ, Inst Optoelect & Solid State Elect, Chiayi 600, Taiwan
[6] Natl Chiayi Univ, Dept Appl Phys, Chiayi 600, Taiwan
关键词
D O I
10.1063/1.2723671
中图分类号
O59 [应用物理学];
学科分类号
摘要
The structures of the Zn-O bonding in ZnO (0002) thin films prepared by metal organic chemical vapor deposition have been studied by reflective second harmonic generation (RSHG). The polar Zn-O bond on the top layer is not canceled out and presents 3 mm symmetrical structures on the well-grown ZnO (0002) surface. The average polar strength of the Zn-O bond is correlated with the quality of the ZnO (0002) thin film. The mirror symmetry is caused by the nonvanished polar of twin boundary due to the mismatch between the ZnO film and sapphire substrate and analyzed using s-polarized RSHG with s-polarized fundamental light irradiation. These results demonstrate that the Zn-O heteropolar bonds on the smooth ZnO surface contribute to the SHG intensity. (c) 2007 American Institute of Physics.
引用
收藏
页数:3
相关论文
共 17 条
[1]  
AKTSIPETROV OA, 1986, ZH EKSP TEOR FIZ, V64, P167
[2]  
BORCHARDTOTT W, 1995, CRYSTALLOGRAPHY, P265
[3]   Second harmonic generation in laser ablated zinc oxide thin films [J].
Cao, H ;
Wu, JY ;
Ong, HC ;
Dai, JY ;
Chang, RPH .
APPLIED PHYSICS LETTERS, 1998, 73 (05) :572-574
[4]   Effect of the substrate temperature on the properties of ZnO films grown by RF magnetron sputtering [J].
Chaabouni, F ;
Abaab, M ;
Rezig, B .
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2004, 109 (1-3) :236-240
[5]  
Fenwick WE, 2007, MATER RES SOC SYMP P, V957, P55
[6]   INHOMOGENEOUS DEFORMATION OF SILICON SURFACE-LAYERS PROBED BY 2ND-HARMONIC GENERATION IN REFLECTION [J].
GOVORKOV, SV ;
EMELYANOV, VI ;
KOROTEEV, NI ;
PETROV, GI ;
SHUMAY, IL ;
YAKOVLEV, VV .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 1989, 6 (06) :1117-1124
[7]   Radiative and nonradiative excitonic transitions in nonpolar (11(2)over-bar-0) and polar (000(1)over-bar) and (0001) ZnO epilayers [J].
Koida, T ;
Chichibu, SF ;
Uedono, A ;
Sota, T ;
Tsukazaki, A ;
Kawasaki, M .
APPLIED PHYSICS LETTERS, 2004, 84 (07) :1079-1081
[8]   Analysis of the growth of RF sputtered ZnO thin films using the optical reflective second harmonic generation [J].
Lo, KY ;
Lo, SC ;
Chu, SY ;
Chang, RC ;
Yu, CF .
JOURNAL OF CRYSTAL GROWTH, 2006, 290 (02) :532-538
[9]   Second-harmonic efficiency of ZnO nanolayers [J].
Neumann, U ;
Grunwald, R ;
Griebner, U ;
Steinmeyer, G ;
Seeber, W .
APPLIED PHYSICS LETTERS, 2004, 84 (02) :170-172
[10]   Atomic structure of [0001]-tilt grain boundaries in ZnO: A high-resolution TEM study of fiber-textured thin films [J].
Oba, F ;
Ohta, H ;
Sato, Y ;
Hosono, H ;
Yamamoto, T ;
Ikuhara, Y .
PHYSICAL REVIEW B, 2004, 70 (12) :125415-1