Optical and electrical properties of Al:WS2 films prepared by atomic layer deposition and vulcanization

被引:20
作者
Li, Ning [1 ]
Feng, Li-ping [1 ]
Su, Jie [1 ]
Zeng, Wei [1 ]
Liu, Zheng-tang [1 ]
机构
[1] Northwestern Polytech Univ, Coll Mat Sci & Engn, State Key Lab Solidificat Proc, Xian 710072, Shaanxi, Peoples R China
基金
中国国家自然科学基金;
关键词
WS2; THIN-FILMS; CATALYTIC-ACTIVITY; BINDING-ENERGIES; DOPED WS2; OXIDE; NANOTUBES; SULFURIZATION; ABSORPTION; SCATTERING; SURFACES;
D O I
10.1039/c6ra10474f
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Composition, structure, optical and electrical properties of Al:WS2 (un-doped and Al-doped WS2) films prepared by atomic layer deposition (ALD) and CS2 vulcanization processing have been studied. Results show that Al:WS2 films grow with a preferential c(perpendicular to)-orientation. The core-level binding energies (BEs) of W 4f, S 2p, O 1s and Al 2s decrease with increasing Al doping content, indicating that Al-doped WS2 films have a p-type conductivity. Optical property analysis shows that the absorption coefficient (similar to 10(7) m(-1)) is comparable to that of WS2 single crystals and that Al doping content can tune the optical band gap of the films. Hall measurements show that p-type conductive Al-doped WS2 films can be obtained by Al doping. Hall mobility values for the un-doped WS2 and 2.40% Al-doped WS2 films are 1.63 x 101 and 9.71 cm(2) V (1) s (1), respectively. Comparing with un-doped WS2 films, the comparable Hall mobility of Al-doped WS2 films can be achieved by appropriate Al doping contents.
引用
收藏
页码:64879 / 64884
页数:6
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