Doping Nature of Group V Elements in ZnO Single Crystals Grown from Melts at High Pressure

被引:7
作者
Taibarei, Nikolai O. [1 ]
Kytin, Vladimir G. [2 ]
Konstantinova, Elizaveta A. [2 ]
Kulbachinskii, Vladimir A. [2 ]
Shalygina, Olga A. [2 ]
Pavlikov, Alexander V. [2 ]
Savilov, Serguei V. [1 ]
Tafeenko, Viktor A. [1 ]
Mukhanov, Vladimir A. [3 ]
Solozhenko, Vladimir L. [3 ]
Baranov, Andrei N. [1 ]
机构
[1] Lomonosov Moscow State Univ, Dept Chem, Moscow 119991, Russia
[2] Lomonosov Moscow State Univ, Dept Phys, Moscow 119991, Russia
[3] Univ Sorbonne Paris Nord, CNRS, LSPM, F-93430 Villetaneuse, France
关键词
THIN-FILMS; PHOTOLUMINESCENCE; RESONANCE; CENTERS;
D O I
10.1021/acs.cgd.1c01507
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Herein, ZnO single crystals doped with group V elements have been grown from melts at high pressure. Dopants were introduced in several forms such as Sb2O3, P, As, Sb, and Zn3X2 (X = P, As, Sb) in a high-pressure cell. Systematic studies of morphology were performed using optical microscopy and scanning electron microscopy. The crystal structure and lattice parameters were studied using X-ray diffraction and X-ray crystallography. Crystals exhibited distinct changes in size, shape, and color compared to undoped ZnO melt-grown single crystals due to the dopant influence. X-ray photoelectron spectroscopy was used to determine the valence states of group V elements when incorporated in the ZnO lattice. Photoluminescence spectroscopy, Raman spectroscopy, and electron paramagnetic resonance spectroscopy were employed to investigate the nature of defects formed as a result of doping. The formation of V-Zn and V-Zn complexes was confirmed, and their concentrations were measured. Estimates of the number of V-Zn per dopant atom showed that the ratio is noticeably higher than the one suggested for the shallow complex As(P,Sb)(Zn)-2V(Zn) commonly regarded as responsible for acceptor properties in ZnO.
引用
收藏
页码:2452 / 2461
页数:10
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