Scanning tunneling microscope measurements of the amplitude of vibration of a quartz crystal oscillator

被引：99
|
作者：
Borovsky, B [1 ]
Mason, BL [1 ]
Krim, J [1 ]
机构：
[1] N Carolina State Univ, Dept Phys, Raleigh, NC 27695 USA
来源：
JOURNAL OF APPLIED PHYSICS | 2000年 / 88卷 / 07期
关键词：
D O I：
10.1063/1.1289235
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We report highly accurate measurements of the vibrational amplitude of a transverse shear mode quartz resonator, obtained by directly imaging the surface oscillatory motion with a scanning tunneling microscope. Amplitude measurements, performed over a range of resonator drive levels and quality factors, agree with theoretical predictions to within a factor of two. (C) 2000 American Institute of Physics. [S0021-8979(00)04419-4].
引用
收藏
页码：4017 / 4021
页数：5
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