Scanning tunneling microscope measurements of the amplitude of vibration of a quartz crystal oscillator

被引：99

作者：

Borovsky, B ^{[1
]}

Mason, BL ^{[1
]}

Krim, J ^{[1
]}

机构：

[1] N Carolina State Univ, Dept Phys, Raleigh, NC 27695 USA

来源：

JOURNAL OF APPLIED PHYSICS | 2000年 / 88卷 / 07期

关键词：

D O I：

10.1063/1.1289235

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report highly accurate measurements of the vibrational amplitude of a transverse shear mode quartz resonator, obtained by directly imaging the surface oscillatory motion with a scanning tunneling microscope. Amplitude measurements, performed over a range of resonator drive levels and quality factors, agree with theoretical predictions to within a factor of two. (C) 2000 American Institute of Physics. [S0021-8979(00)04419-4].

引用

页码：4017 / 4021

页数：5

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