Buckling of Stressed and Pressurized Thin Films on Substrates

被引：13

作者：

Dion, Eloi ^{[1
]}

Grilhe, Jean ^{[2
]}

Colin, Jerome ^{[2
]}

Coupeau, Christophe ^{[2
]}

机构：

[1] Univ Poitiers, UMR6630, CNRS, PHYMAT, F-86962 Futuroscope, France

[2] Univ Poitiers, SP2MI Teleport, F-86962 Futuroscope, France

来源：

JOURNAL OF APPLIED MECHANICS-TRANSACTIONS OF THE ASME | 2010年 / 77卷 / 04期

关键词：

buckling; internal stresses; metallic thin films; nickel; FRACTURE-MECHANICS ANALYSIS; AFM OBSERVATIONS; DELAMINATION;

D O I：

10.1115/1.4000923

中图分类号：

O3 [力学];

学科分类号：

08 ; 0801 ;

摘要：

The buckling solutions for a stressed thin film deposited on a semi-infinite rigid substrate have been determined in the framework of the Foumlppl-von Karman's theory of thin plates and the perturbed bifurcation theory when pressures are applied onto the lower and upper free surfaces of the buckled film. It is found that the equilibrium solutions of the film are modified compared with the classical case of the Euler column, as well as the critical stress above which the film buckles.

引用

页码：1 / 5

页数：5

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