Resistance to European corn borer in processing sweet corn

被引:2
|
作者
Gardner, J
Hoffmann, HP
Smith, ME
机构
[1] Cornell Univ, Dept Entomol, Ithaca, NY 14853 USA
[2] Cornell Univ, Dept Plant Breeding, Ithaca, NY 14853 USA
关键词
damage scale; maturation rate; Ostrinia nubilalis; Zea mays;
D O I
10.21273/HORTSCI.35.5.871
中图分类号
S6 [园艺];
学科分类号
0902 ;
摘要
Trials were conducted in 1997 and 1998 to determine if there is a range of resistance to European corn borer [Ostrinia nubilalis (Hubner)] (ECB) in commercially available processing sweet corn (Zea mays L.). Twelve processing corn cultivars were tested in 1997 and 18 cultivars in 1998. About 40 first instar larvae of colony-reared ECB were used to infest plants in both whorl and silking stages of growth. At harvest, plants infested at the whorl stage were evaluated for numbers of larvae and larval tunnels, and length of larval tunnels. Plants infested at the silking stage were evaluated for number of larvae per ear and were rated for ear damage using a 9-point scale. Resistance rankings among cultivars were consistent between years and between silk- and whorl-infested plants. We conclude that there is a substantial range of resistance already present in processing sweet corn cultivars, and that resistance is probably a combination of both exclusion and suppression of feeding. Our findings have two immediate uses: incorporation into existing IPM programs and incorporation of identifiable resistance bearing cultivars into a long-term breeding program for resistance to ECB in sweet corn.
引用
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页码:871 / 874
页数:4
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