Validating S-parameter measurements of RF integrated circuits at milli-Kelvin temperatures

被引：9

作者：

Stanley, M. ^{[1
]}

Parker-Jervis, R. ^{[2
]}

de Graaf, S. ^{[3
]}

Lindstrom, T. ^{[3
]}

Cunningham, J. E. ^{[2
]}

Ridler, N. M. ^{[1
]}

机构：

[1] Natl Phys Lab, Electromagnet & Electrochem Technol Dept, Teddington, Middx, England

[2] Univ Leeds, Sch Elect & Elect Engn, Leeds, W Yorkshire, England

[3] Natl Phys Lab, Quantum Technol Dept, Teddington, Middx, England

来源：

ELECTRONICS LETTERS | 2022年 / 58卷 / 16期

基金：

英国科研创新办公室; 英国工程与自然科学研究理事会;

关键词：

Parameter estimation - Quantum computers - Quantum optics - Scattering parameters - Timing circuits;

D O I：

10.1049/ell2.12545

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Techniques to precisely characterise RF components at milli-Kelvin temperatures support the development of quantum computing systems utilising these components. In this work, an S-parameter measurement setup to characterise RF integrated circuits at milli-Kelvin temperatures has been proposed and for the first time, the S-parameter measurements at milli-Kelvin temperatures have been validated using two independent calibration techniques, thereby providing more confidence in measurements. The techniques are demonstrated experimentally by comparing and validating calibrated S-parameter measurements of a cryogenic attenuator integrated circuits at milli-Kelvin temperatures.

引用

页码：614 / 616

页数：3

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