Atomic mechanism of the phase transition in monolayer bismuthene on copper oxide

被引:9
作者
Zhou, Dechun [1 ]
Yang, Chao [2 ]
Bu, Saiyu [3 ]
Pan, Feng [4 ]
Si, Nan [1 ]
He, Pimo [2 ]
Ji, Qingmin [1 ]
Lu, Yunhao [2 ]
Niu, Tianchao [1 ]
机构
[1] Nanjing Univ Sci & Technol, Sch Mat Sci & Engn, Herbert Gleiter Inst Nanosci, Nanjing 210094, Peoples R China
[2] Zhejiang Univ, Dept Phys, Hangzhou 310027, Peoples R China
[3] Shanghai Jiao Tong Univ, Sch Mech Engn, Shanghai 200240, Peoples R China
[4] Beihang Univ, Res Inst Frontier Sci, Beijing 100083, Peoples R China
基金
中国国家自然科学基金;
关键词
SCANNING-TUNNELING-MICROSCOPY; ELECTRONIC-PROPERTIES; EPITAXIAL-GROWTH; BI; INSULATOR; FILMS;
D O I
10.1103/PhysRevMaterials.5.064002
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Problems associated with large-scale growth of high-quality single-layer bismuthene constitute one of the main obstacles to the applications of bismuthene in electronic devices. Here we report the direct synthesis of high-quality bismuthene using molecular-beam epitaxy on dielectric copper oxide thin films. Scanning tunneling microscopy (STM) reveals the generation of dimer pair arrays and black-phosphorus-like bismuthene (BKP-Bi, alpha phase) at the initial stage on Cu3O2/Cu(111) surface. A phase transition from BKP-Bi to blue-phosphorus-like bismuthene (BLP-Bi, beta phase) is characterized by high-resolution STM, complemented with first-principles calculations based on density-functional theory (DFT) showing a bond-breaking path. Employing the phase transition, we also demonstrate the construction of an atomically sharp in-plane homojunction along the phase boundary. DFT calculations reveal a one-dimensional edge state along the homojunction.
引用
收藏
页数:8
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