X-ray diffraction imaging of bulk polycrystalline materials

被引:11
作者
Wroblewski, T
Bjeoumikhov, A
机构
[1] DESY, Hamburger Synchrontronstschlungslab HASYLAB, D-22607 Hamburg, Germany
[2] Inst Geratebau GmbH, IFG, D-12489 Berlin, Germany
关键词
X-ray diffraction; X-ray imaging;
D O I
10.1016/j.nima.2004.09.022
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
X-ray diffraction imaging applies an array of parallel capillaries in front of a position sensitive detector. The use of conventional micro channel plates of few millimeter thickness as collimator array requires short sample to detector distances to achieve high spatial resolution. Progress in the fabrication of long polycapillaries allowed to increase the sample to detector distance without decreasing resolution. Furthermore these 300 mm long capillaries can be used with high X-ray energies enabling bulk investigations in transmission geometry. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:771 / 777
页数:7
相关论文
共 10 条
  • [1] Synchrotron radiation beam splitting and filtering by a polycapillary array
    Arkadiev, V
    Bzhaumikhov, A
    Erko, A
    Schafers, F
    Chevallier, P
    Populus, P
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1997, 384 (2-3) : 547 - 551
  • [2] Polycapillary structure as x-ray window for differential vacuum pumping
    Arkadiev, VA
    Beloglazov, VI
    Bzhaumikhov, AA
    Gorny, HE
    Langhoff, N
    Margushev, Z
    Schmalz, J
    Wedell, R
    Wolff, H
    [J]. X-RAY OPTICS, INSTRUMENTS, AND MISSIONS, 1998, 3444 : 436 - 442
  • [3] BJEOMIKHOV AA, Patent No. 19527794
  • [4] New generation of polycapillary lenses: manufacture and applications
    Bjeoumikhov, A
    Langhoff, N
    Wedell, R
    Beloglazov, V
    Lebed'ev, N
    Skibina, N
    [J]. X-RAY SPECTROMETRY, 2003, 32 (03) : 172 - 178
  • [5] A new diffractometer for materials science and imaging at HASYLAB beamline G3
    Wroblewski, T
    Clauss, O
    Crostack, HA
    Ertel, A
    Fandrich, F
    Genzel, C
    Hradil, K
    Ternes, W
    Woldt, E
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1999, 428 (2-3) : 570 - 582
  • [6] X-RAY-IMAGING OF POLYCRYSTALLINE MATERIALS
    WROBLEWSKI, T
    GEIER, S
    HESSMER, R
    SCHRECK, M
    RAUSCHENBACH, B
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (06) : 3560 - 3562
  • [7] Processing of X-ray diffraction imaging data using remote sensing techniques
    Wroblewski, T
    Wild, E
    Poeste, T
    Pyzalla, A
    [J]. JOURNAL OF MATERIALS SCIENCE LETTERS, 2000, 19 (11) : 975 - 978
  • [8] Small-angle X-ray imaging
    Wroblewski, T
    Bjeoumikhov, A
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2004, 521 (2-3) : 571 - 575
  • [9] Self-organized criticality - a model for recrystallization ?
    Wroblewski, T
    [J]. ZEITSCHRIFT FUR METALLKUNDE, 2002, 93 (12): : 1228 - 1232
  • [10] Strain mapping by diffraction imaging
    Wroblewski, T
    Almanstötter, J
    Clauss, O
    Moneke, M
    Pirling, T
    Schade, P
    [J]. MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2000, 288 (02): : 126 - 131