Effect of CdO interlayer on electrical characteristics in Se-Bi diodes

被引:18
作者
Champness, CH [1 ]
Xu, Z [1 ]
机构
[1] McGill Univ, Dept Elect Engn, Montreal, PQ H3A 2A7, Canada
关键词
D O I
10.1016/S0169-4332(97)00562-X
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The introduction of an interlayer of CdO, of thickness up to 0.42 mu m, between a layer of crystallized selenium and one of bismuth in the form of a Se-CdO-Bi diode, was found to increase the frequency below which negative capacitance appeared in forward bias. The effect is attributed either to increased carrier transit time across the interlayer or to a reduction of internal capacitance in the presence of an existing inductive influence. An equivalent circuit model of a Se-metal diode, involving a hypothetical fixed inductor, was developed, which correctly traces out the type of observed variation of measured diode capacitance with bias and frequency. (C) 1998 Elsevier Science B.V.
引用
收藏
页码:485 / 489
页数:5
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