Preface of special issue on VLSI design and test

被引：0

|

作者：

Yang, Laurence T.

Delgado-Frias, Jose G.

Li, Yiming

Niamat, Mohammed

Soudris, Dimitrios

Vemuru, Srinivasa R.

机构：

[1] Washington State Univ, Washington, DC USA

[2] Univ Toledo, Toledo, OH 43606 USA

来源：

MICROELECTRONIC ENGINEERING | 2007年 / 84卷 / 02期

关键词：

D O I：

10.1016/j.mee.2006.12.005

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：193 / 193

页数：1

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