Crystal structure of rare-earth silicon-oxynitride J-phases, Ln4Si2O7N2

被引:15
|
作者
Takahashi, J [1 ]
Yamane, H
Hirosaki, N
Yamamoto, Y
Mitomo, M
Shimada, M
机构
[1] Tohoku Univ, Inst Multidisciplinary Res Adv Mat, Sendai, Miyagi 9808577, Japan
[2] Tohoku Univ, Ctr Interdisciplinary Res, Sendai, Miyagi 9808578, Japan
[3] Natl Inst Mat Sci, Tsukuba, Ibaraki 3050044, Japan
关键词
powders-solid-state reaction; X-ray methods; rare-earth silicon-oxynitrides; Ln(4)Si(2)O(7)N(2);
D O I
10.1016/j.jeurceramsoc.2004.02.008
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Rare-earth silicon-oxynitride J-phases, Ln(4)Si(2)O(7)N(2) (Ln = Y, La, Pr, Nd, Sm, Gd, Tb, Dy, Ho, Er, Tm, Yb, and Lu), were prepared by the N-2 gas-pressured sintering method at 1 MPa of N-2 and 1500-1700 degrees C. The Rietveld analysis was carried out for X-ray powder diffraction data measured at room temperature. The crystal structures of Ln(4)Si(2)O(7)N(2) were refined with the structure model of La4Si2O7N2 for Ln = La, Pr, Nd, and Sm, and with that of Lu4Si2O7N2 for Ln = Y, Gd, Tb, Dy, Ho, Er, Tm, Yb, and Lu. The refined monoclinic unit-cell parameters (lengths a, b, c, angles beta, and volume V) increased linearly in their two series of Ln with increasing ionic radii of rare-earth atoms. Discontinuities of the unit-cell parameters were found between the two Ln series. (c) 2004 Elsevier Ltd. All rights reserved.
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页码:793 / 799
页数:7
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