Theory of interface resistances

被引：9

作者：

Schep, KM

van Hoof, JBAN

Kelly, PJ

Bauer, GEW

Inglesfield, JE

机构：

[1] Delft Univ Technol, Fac Appl Phys, NL-2628 CJ Delft, Netherlands

[2] Delft Univ Technol, DIMES, NL-2628 CJ Delft, Netherlands

[3] Univ Nijmegen, Dept Theoret Phys, NL-6525 ED Nijmegen, Netherlands

[4] Philips Res Labs, NL-5656 AA Eindhoven, Netherlands

[5] Univ Wales, Dept Phys & Astron, Cardiff CF2 3YB, S Glam, Wales

来源：

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 1998年 / 177卷

关键词：

interface resistance; magnetoresistance; -; giant; theory; electrical transport; electronic structure;

D O I：

10.1016/S0304-8853(97)00749-X

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The interface resistances of magnetic multilayers are calculated without an adjustable parameters by combining first-principles electronic structure calculations with the Boltzmann equation. The microscopic mechanism of specular interface scattering in combination with diffuse bulk scattering can largely explain the experimentally observed values for the interface resistances of Co/Cu multilayers. (C) 1998 Elsevier Science B.V. All rights reserved.

引用

页码：1166 / 1167

页数：2

共 6 条

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vanHoof, JBAN
Kelly, PJ
Bauer, GEW
Inglesfield, JE
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