Heavy Ion Induced Single-Event Latchup Screening of Integrated Circuits Using Commercial Off-the-Shelf Evaluation Boards

被引：0

作者：

Allen, Gregory R. ^{[1
]}

Irom, Farokh ^{[1
]}

Scheick, Leif ^{[1
]}

Vartanian, Sergeh ^{[1
]}

O'Connor, Michael ^{[1
]}

机构：

[1] CALTECH, Jet Prop Lab, 4800 Oak Grove Dr, Pasadena, CA 91109 USA

来源：

2016 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW) | 2016年

关键词：

commercial-off-the-shelf; single-event latchup; heavy ions;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We present heavy ion single-event latchup (SEL) screening data for a variety of commercial-off-the-shelf (COTS) devices intended for use on low-cost missions, and discuss the device preparation techniques used to expose the die for ground-based heavy-ion testing.

引用

页码：63 / 69

页数：7