Core-level X-ray photoelectron spectra and X-ray photoelectron diffraction of RuO2(110) grown by molecular beam epitaxy on TiO2(110)

被引：92

作者：

Kim, YJ ^{[1
]}

Gao, Y ^{[1
]}

Chambers, SA ^{[1
]}

机构：

[1] Pacific NW Lab, Environm Mol Sci Lab, Richland, WA 99352 USA

来源：

APPLIED SURFACE SCIENCE | 1997年 / 120卷 / 3-4期

关键词：

D O I：

10.1016/S0169-4332(97)00233-X

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We have measured Ru 3d, 4s, 4p and O Is high-resolution core-level X-ray photoelectron spectra, along with Ru 3d and O Is scanned-angle X-ray photoelectron diffraction angular distributions, for RuO2(110). The surfaces were prepared by oxygen-plasma-assisted molecular beam epitaxial growth of RuO2 on TiO2(110). XPS spectral interpretation and the nature of the XPD scans strongly suggest that the complex line shapes are due to final-state screening effects, rather than the presence of Ru in oxidation states other than +4. (C) 1997 Elsevier Science B.V.

引用

页码：250 / 260

页数：11

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