Characterization of graphite implanted with chlorine ions using combined Raman microspectrometry and transmission electron microscopy on thin sections prepared by focused ion beam

被引:37
作者
Ammar, M. R. [1 ]
Rouzaud, J. N. [1 ]
Vaudey, C. E. [2 ]
Toulhoat, N. [2 ,3 ]
Moncoffre, N. [2 ]
机构
[1] Ecole Normale Super, CNRS, UMR 8538, Geol Lab, F-75231 Paris 5, France
[2] Univ Lyon 1, CNRS, UMR5828, IPNL,IN2P3, F-69622 Villeurbanne, France
[3] CEA, DEN, Ctr Saclay, F-91191 Gif Sur Yvette, France
关键词
CARBON; FIB; IRRADIATION; MICROANALYSIS; SPECTROSCOPY; MICROTEXTURE; SPECIMENS; BEHAVIOR; SPECTRA; SAMPLES;
D O I
10.1016/j.carbon.2009.11.049
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Graphite was modified by 250 keV Cl-37(+) ion implantation. Combined Raman microspectrometry/transmission electron microscopy (TEM) studies have been used to characterize the multiscale organization of the graphite structure. The penetration depth of C-37(+) into the graphite sample was limited to the surface (similar to 200 nm) because of the dissipation of the irradiating ion energy as expected by secondary ion mass spectrometry analysis. Raman microspectrometry appears to be an appropriate tool for studying such scales. Spectra showed a strong increase of defect bands after implantation at a fluence of 5 - 10(13) ions/cm(2). In order to examine the structural degradation of the graphite versus the depth at the nanometer scale, the focused ion beam technique seems to be a well-suited method for a relevant coupling of Raman and TEM observations. (C) 2009 Elsevier Ltd. All rights reserved.
引用
收藏
页码:1244 / 1251
页数:8
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