Electrons above helium films on metal substrates

被引:8
作者
Angrik, J [1 ]
Faustein, A [1 ]
Klier, J [1 ]
Leiderer, P [1 ]
机构
[1] Univ Konstanz, Dept Phys, D-78457 Constance, Germany
关键词
D O I
10.1023/B:JOLT.0000049060.15686.b6
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report about our investigations on two-dimensional electron ensembles floating above thin helium films supported by metallic substrates. We found a surprisingly high stability of these electrons, although the substrates were conducting which allows breakthrough at weak spots of the helium film due to roughness peaks. We have measured the electron densities and corresponding relaxation times. By putting the electrons from the area above the loading electrode to the area above a separate electrode one can enhance the lifetime of these surface state electrons.
引用
收藏
页码:335 / 344
页数:10
相关论文
共 11 条
[1]  
Andrei E Y., 1997, Two-Dimensional Electron Systems: on Helium and other Cryogenic Substrates, DOI DOI 10.1007/978-94-015-1286-2_17
[2]   STABILITY OF CHARGED HE-4 FILMS [J].
ETZ, H ;
GOMBERT, W ;
IDSTEIN, W ;
LEIDERER, P .
PHYSICAL REVIEW LETTERS, 1984, 53 (27) :2567-2570
[3]  
GRIMES CC, 1974, PHYS REV LETT, V32, P280, DOI 10.1103/PhysRevLett.32.280
[4]   Colloquium:: The physics of charge inversion in chemical and biological systems [J].
Grosberg, AY ;
Nguyen, TT ;
Shklovskii, BI .
REVIEWS OF MODERN PHYSICS, 2002, 74 (02) :329-345
[5]  
HU XL, 1990, PHYS REV B, V2, P2010
[6]   STABILITY OF HELIUM FILMS CHARGED WITH ELECTRONS [J].
IKEZI, H ;
PLATZMAN, PM .
PHYSICAL REVIEW B, 1981, 23 (03) :1145-1148
[7]   Metal-insulator transition in two-dimensional electron systems [J].
Kravchenko, SV ;
Sarachik, MP .
REPORTS ON PROGRESS IN PHYSICS, 2004, 67 (01) :1-44
[8]   DETERMINATION OF SURFACE-ROUGHNESS OF THIN-FILMS USING MEASUREMENT OF ANGULAR-DEPENDENCE OF SCATTERED LIGHT FROM SURFACE PLASMA-WAVES [J].
KRETSCHMANN, E .
OPTICS COMMUNICATIONS, 1974, 10 (04) :353-356
[9]   ELECTRONS ON FILMS OF HELIUM - A QUANTUM-MECHANICAL TWO-DIMENSIONAL FERMION SYSTEM [J].
PEETERS, FM ;
PLATZMAN, PM .
PHYSICAL REVIEW LETTERS, 1983, 50 (25) :2021-2023
[10]   Dip problem of the electron mobility on a thin helium film -: art. no. 073401 [J].
Shikin, V ;
Klier, J ;
Doicescu, I ;
Würl, A ;
Leiderer, P .
PHYSICAL REVIEW B, 2001, 64 (07) :734011-734014