Accelerating diagnosis via dominance relations between sets of faults

被引：18

作者：

Adapa, Rajsekhar ^{[1
]}

Tragoudas, Spyros ^{[1
]}

Michael, Maria K. ^{[2
]}

机构：

[1] Southern Illinois Univ, Dept ECE, Carbondale, IL 62901 USA

[2] Univ Cyprus, Dept ECE, CY-1678 Nicosia, Cyprus

来源：

25TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS | 2007年

关键词：

D O I：

10.1109/VTS.2007.10

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

A new way of fault collapsing for effect-cause diagnosis is presented. In contrast to existing dominance-based methods which operate on a pair of faults, the proposed method operates on pairs of sets of faults. The impact of the proposed method is evaluated with respect to effect-cause diagnosis. Experimental results show that the proposed collapsing methods can reduce the diagnostic simulation time on an average of 31% when compared to the existing techniques.

引用

页码：219 / +

页数：2

共 10 条

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