Research on the Multiphysics Field-Circuit Coupling Model of Press Pack IGBT Considering the Application of Hybrid HVDC Breakers

被引:19
作者
Deng, Erping [1 ]
Wenzel, Oliver [1 ]
Zhao, Zhibin [1 ]
Zhang, Yiming [1 ]
Ying, Xiaoliang [1 ,2 ]
Li, Jinyuan [2 ]
Huang, Yongzhang [1 ]
机构
[1] North China Elect Power Univ, State Key Lab Alternate Elect Power Syst Renewabl, Beijing 102206, Peoples R China
[2] North China Elect Power Univ, State Grid Global Energy Interconnect Res Inst, Beijing 102211, Peoples R China
基金
中国国家自然科学基金;
关键词
Insulated gate bipolar transistors; HVDC transmission; Integrated circuit modeling; Fault currents; Solid modeling; Clamps; Couplings; Electro-thermo-mechanical model; field-circuit coupling model; hybrid high voltage direct current (HVdc) breakers; press pack insulated gate bipolar transistor (PP IGBT); MECHANICAL ANALYSIS;
D O I
10.1109/JESTPE.2020.3019433
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Press pack insulated gate bipolar transistor (PP IGBT) is suitable for the hybrid high voltage direct current (HVdc) breaker to clear the fault current of the flexible HVdc transmission system with its advantages of double-side cooling, short-circuit failure mode, and easy to connect in series. However, it should have the ability to transmit the fault current, which is up to five or six times of its rated current, within several milliseconds depending on the distances between two stations without external cooling system. The junction temperature of PP IGBT will increase sharply and it is not possible to be measured during that situation. Therefore, the accurate prediction of junction temperature is extremely important for the packaging design of PP IGBT according to its working condition. In this article, an electro-thermo-mechanical multiphysics field-circuit coupling model of PP IGBT, which is coupled with the electrical, thermal, and mechanical fields, is proposed to predict the collector current, clamping force, and junction temperature. The 3-D mechanical model is decoupled with the 1-D electro-thermal Cauer network model to simplify this multiphysics model without reducing its accuracy. Both the normal and worst working conditions are analyzed through this multiphysics field-circuit model.
引用
收藏
页码:4854 / 4864
页数:11
相关论文
共 26 条
[11]   Development of a thermal resistance model for chip-on-board packaging of high power LED arrays [J].
Ha, Minseok ;
Graham, Samuel .
MICROELECTRONICS RELIABILITY, 2012, 52 (05) :836-844
[12]  
Hafner J., 2011, The Electric Power System of the Future - Integrating Supergrids and Microgrids International Symposium, P9
[13]   Electro-Thermo-Mechanical Analysis of High-Power Press-Pack Insulated Gate Bipolar Transistors under Various Mechanical Clamping Conditions [J].
Hasmasan, Adrian Augustin ;
Busca, Cristian ;
Teodorescu, Remus ;
Helle, Lars ;
Blaabjerg, Frede .
IEEJ JOURNAL OF INDUSTRY APPLICATIONS, 2014, 3 (03) :192-197
[14]   HVDC transmission for large offshore wind farms [J].
Kirby, NM ;
Xu, L ;
Luckett, M ;
Siepmann, W .
POWER ENGINEERING JOURNAL, 2002, 16 (03) :135-141
[15]  
Li J., 2017, 2017 6 AS PAC C ANT, P1, DOI DOI 10.1109/APCAP.2017.8420852
[16]   Thermo-mechanical simulation of a multichip press-packed IGBT [J].
Pirondi, A ;
Nicoletto, G ;
Cova, P ;
Pasqualetti, M ;
Portesine, M ;
Zani, PE .
SOLID-STATE ELECTRONICS, 1998, 42 (12) :2303-2307
[17]   Thermo-mechanical finite element analysis in press-packed IGBT design [J].
Pirondi, A ;
Nicoletto, G ;
Cova, P ;
Pasqualetti, M ;
Portesine, M .
MICROELECTRONICS RELIABILITY, 2000, 40 (07) :1163-1172
[18]   Influence of the clamping pressure on the electrical, thermal and mechanical behaviour of press-pack IGBTs [J].
Poller, T. ;
D'Arco, S. ;
Hernes, M. ;
Ardal, A. Rygg ;
Lutz, J. .
MICROELECTRONICS RELIABILITY, 2013, 53 (9-11) :1755-1759
[19]   Mechanical analysis of press-pack IGBTs [J].
Poller, T. ;
Basler, T. ;
Hernes, M. ;
D'Arco, S. ;
Lutz, J. .
MICROELECTRONICS RELIABILITY, 2012, 52 (9-10) :2397-2402
[20]  
Szekely V., 2003, ELEC ENG HANDB SER, P1201