Phase imaging with intermodulation atomic force microscopy

被引：19

作者：

Platz, Daniel ^{[1
]}

Tholen, Erik A. ^{[1
]}

Hutter, Carsten ^{[1
,2
]}

von Bieren, Arndt C. ^{[1
]}

Haviland, David B. ^{[1
]}

机构：

[1] Royal Inst Technol, SE-10691 Stockholm, Sweden

[2] Stockholm Univ, Dept Phys, SE-10691 Stockholm, Sweden

来源：

ULTRAMICROSCOPY | 2010年 / 110卷 / 06期

关键词：

Atomic force microscopy; Intermodulation; Multifrequency AFM; Phase imaging; MODE;

D O I：

10.1016/j.ultramic.2010.02.012

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Intermodulation atomic force microscopy (IMAFM) is a dynamic mode of atomic force microscopy (AFM) with two-tone excitation. The oscillating AFM cantilever in close proximity to a surface experiences the nonlinear tip-sample force which mixes the drive tones and generates new frequency components in the cantilever response known as intermodulation products (IMPs). We present a procedure for extracting the phase at each IMP and demonstrate phase images made by recording this phase while scanning. Amplitude and phase images at intermodulation frequencies exhibit enhanced topographic and material contrast. (C) 2010 Elsevier B.V. All rights reserved.

引用

收藏

页码：573 / 577

页数：5

相关论文

共 18 条

[1] ATOMIC FORCE MICROSCOPE [J].

BINNIG, G ;

QUATE, CF ;

GERBER, C .

PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933

[2] Energy dissipation in tapping-mode atomic force microscopy [J].

Cleveland, JP ;

Anczykowski, B ;

Schmid, AE ;

Elings, VB .

APPLIED PHYSICS LETTERS, 1998, 72 (20) :2613-2615

[3] Noninvasive determination of optical lever sensitivity in atomic force microscopy [J].

Higgins, MJ ;

Proksch, R ;

Sader, JE ;

Polcik, M ;

Mc Endoo, S ;

Cleveland, JP ;

Jarvis, SP .

REVIEW OF SCIENTIFIC INSTRUMENTS, 2006, 77 (01) :1-5

[4] Higher-harmonics generation in tapping-mode atomic-force microscopy: Insights into the tip-sample interaction [J].

Hillenbrand, R ;

Stark, M ;

Guckenberger, R .

APPLIED PHYSICS LETTERS, 2000, 76 (23) :3478-3480

[5] Inverting amplitude and phase to reconstruct tip-sample interaction forces in tapping mode atomic force microscopy [J].

Hu, Shuiqing ;

Raman, Arvind .

NANOTECHNOLOGY, 2008, 19 (37)

[6] Chaos in atomic force microscopy [J].

Hu, SQ ;

Raman, A .

PHYSICAL REVIEW LETTERS, 2006, 96 (03)

[7] The band excitation method in scanning probe microscopy for rapid mapping of energy dissipation on the nanoscale [J].

Jesse, Stephen ;

Kalinin, Sergei V. ;

Proksch, Roger ;

Baddorf, A. P. ;

Rodriguez, B. J. .

NANOTECHNOLOGY, 2007, 18 (43)

[8] General theory of amplitude-modulation atomic force microscopy [J].

Lee, Manhee ;

Jhe, Wonho .

PHYSICAL REVIEW LETTERS, 2006, 97 (03)

[9] Theory of multifrequency atomic force microscopy [J].

Lozano, Jose R. ;

Garcia, Ricardo .

PHYSICAL REVIEW LETTERS, 2008, 100 (07)

[10] Bimodal atomic force microscopy imaging of isolated antibodies in air and liquids [J].

Martinez, N. F. ;

Lozano, J. R. ;

Herruzo, E. T. ;

Garcia, F. ;

Richter, C. ;

Sulzbach, T. ;

Garcia, R. .

NANOTECHNOLOGY, 2008, 19 (38)