Synthesis of Tetragonal Cu2NiSnS4 Thin Film via Low-Cost Electrodeposition Method: Effect of Ni2+ Molarity

被引:23
作者
Beraich, M. [1 ,2 ,3 ]
Taibi, M. [2 ]
Guenbour, A. [3 ]
Zarrouk, A. [3 ]
Bellaouchou, A. [3 ]
Fahoume, M. [1 ]
机构
[1] Ibn Tofail Univ, Dept Phys, Lab Phys Condensed Matter, Kenitra, Morocco
[2] Univ Mohammed 5, Ecole Normale Super, LPCMIO, CSM, Rabat, Morocco
[3] Mohammed V Univ, Fac Sci, Lab Mat Nanotechnol & Environm, Av Ibn Battouta,Box 1014, Rabat, Morocco
关键词
Thin film; Cu2NiSnS4; cyclic voltammetry; effect of Ni2+ molarity; electrodeposition; solar cell; ELECTRICAL-PROPERTIES; OPTICAL-PROPERTIES; SOLAR-CELLS; CU2MSNS4; M; NANOPARTICLES; TEMPERATURE; TIN; FABRICATION; CU2FESNS4; STRATEGY;
D O I
10.1007/s11664-019-07707-4
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Quaternary semiconductor Cu2NiSnS4 (CNTS) has emerged as an ideal material for solar cells and has attracted the attention of researchers. Tetragonal-structured CNTS thin films have been successfully synthesized via sulfurization (500 degrees C, argon + sulfur) of co-electrodeposited Cu-Sn-Ni-S precursors on molybdenum (Mo) substrate. The effects of the Ni2+ molarity on the deposition potential, structure, composition, morphology, and optical bandgap of the CNTS thin film were examined by using cyclic voltammetry, Raman spectroscopy, x-ray diffraction analysis, scanning electron microscopy (SEM), energy-dispersive x-ray (EDX) spectrometry, and ultraviolet-visible (UV-Vis) spectrophotometer. X-ray diffraction and Raman analyses confirmed formation of CNTS with tetragonal structure and average crystallite size of 17 nm to 20 nm. SEM revealed that the films were homogeneous, while EDX confirmed the presence of Cu-Ni-Sn-S, and the bandgap of the CNTS thin films was evaluated to lie in the range of 1.6 eV to 1.8 eV, making CNTS a strong candidate material for use in photovoltaic cells.
引用
收藏
页码:728 / 735
页数:8
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