共 50 条
- [1] Effect of three-fold astigmatism on high resolution electron micrographs ULTRAMICROSCOPY, 1 (103-113):
- [5] HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY OF GRAIN-BOUNDARIES JOURNAL OF METALS, 1987, 39 (07): : A31 - A31
- [6] THE USE OF HISTOGRAMS FOR TRANSMISSION ELECTRON-MICROSCOPY - DEFOCUS AND ASTIGMATISM CORRECTION AT HIGH-RESOLUTION JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1985, 2 (04): : 371 - 387
- [8] DETERMINING GRAIN-BOUNDARY STRUCTURES BY HIGH-RESOLUTION ELECTRON-MICROSCOPY JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1988, 13 (03): : A20 - A20