X-ray pinpoint structural measurement for nanomaterials and devices at BL40XU of the SPring-8

被引:0
作者
Kimura, Shigeru [1 ,2 ]
Moritomo, Yutaka [1 ,2 ]
Tanaka, Yoshihito [1 ,2 ]
Tanaka, Hitoshi [1 ,2 ]
Toriumi, Koshiro [1 ,2 ]
Kato, Kenichi [1 ,2 ]
Yasuda, Nobuhiro [1 ,2 ]
Fukuyama, Yoshimitsu [1 ,2 ]
Kim, Jungeun [1 ,2 ]
Murayama, Haruno [1 ,2 ]
Takata, Masaki [1 ,2 ]
机构
[1] JASRI, SPring 8, Sayo, Hyogo 6795198, Japan
[2] Japan Sci & Technol Agcy, Japan & CREST, Kawaguchi, Saitama 3320012, Japan
来源
SYNCHROTRON RADIATION INSTRUMENTATION, PTS 1 AND 2 | 2007年 / 879卷
关键词
pinpoint; nanomaterial; device; synchrotron radiation; femtsecond laser; pump and probe; microdiffraction;
D O I
暂无
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The pulse characteristic and high coherent x-ray beam of SPring-8 allow us to investigate dynamics of chemical reactions and phase transition of materials caused by applied field. In order to realize such direct investigation,,,x-ray pinpoint structural measurement", which is the advanced x-ray measurement technique in nanometer spatial scale and/or pico-second time scale, is being developed at SPring-8. The features of "x-ray pinpoint structural measurement" technique are, 1) spatial resolution: similar to 100 mn, 2) time resolution: similar to 40 ps, and 3) measurement under the photo-irradiation, electric field, magnetic field, high pressure and active devices. Using this technique, we will explore the novel concept and new phenomena for nanomaterials and/or devices, and also demonstrate their validity.
引用
收藏
页码:1238 / +
页数:2
相关论文
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