X-ray pinpoint structural measurement for nanomaterials and devices at BL40XU of the SPring-8

被引：0

作者：

Kimura, Shigeru ^{[1
,2
]}

Moritomo, Yutaka ^{[1
,2
]}

Tanaka, Yoshihito ^{[1
,2
]}

Tanaka, Hitoshi ^{[1
,2
]}

Toriumi, Koshiro ^{[1
,2
]}

Kato, Kenichi ^{[1
,2
]}

Yasuda, Nobuhiro ^{[1
,2
]}

Fukuyama, Yoshimitsu ^{[1
,2
]}

Kim, Jungeun ^{[1
,2
]}

Murayama, Haruno ^{[1
,2
]}

Takata, Masaki ^{[1
,2
]}

机构：

[1] JASRI, SPring 8, Sayo, Hyogo 6795198, Japan

[2] Japan Sci & Technol Agcy, Japan & CREST, Kawaguchi, Saitama 3320012, Japan

来源：

SYNCHROTRON RADIATION INSTRUMENTATION, PTS 1 AND 2 | 2007年 / 879卷

关键词：

pinpoint; nanomaterial; device; synchrotron radiation; femtsecond laser; pump and probe; microdiffraction;

D O I：

暂无

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The pulse characteristic and high coherent x-ray beam of SPring-8 allow us to investigate dynamics of chemical reactions and phase transition of materials caused by applied field. In order to realize such direct investigation,,,x-ray pinpoint structural measurement", which is the advanced x-ray measurement technique in nanometer spatial scale and/or pico-second time scale, is being developed at SPring-8. The features of "x-ray pinpoint structural measurement" technique are, 1) spatial resolution: similar to 100 mn, 2) time resolution: similar to 40 ps, and 3) measurement under the photo-irradiation, electric field, magnetic field, high pressure and active devices. Using this technique, we will explore the novel concept and new phenomena for nanomaterials and/or devices, and also demonstrate their validity.

引用

页码：1238 / +

页数：2

共 3 条

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