共 3 条
X-ray pinpoint structural measurement for nanomaterials and devices at BL40XU of the SPring-8
被引:0
作者:
Kimura, Shigeru
[1
,2
]
Moritomo, Yutaka
[1
,2
]
Tanaka, Yoshihito
[1
,2
]
Tanaka, Hitoshi
[1
,2
]
Toriumi, Koshiro
[1
,2
]
Kato, Kenichi
[1
,2
]
Yasuda, Nobuhiro
[1
,2
]
Fukuyama, Yoshimitsu
[1
,2
]
Kim, Jungeun
[1
,2
]
Murayama, Haruno
[1
,2
]
Takata, Masaki
[1
,2
]
机构:
[1] JASRI, SPring 8, Sayo, Hyogo 6795198, Japan
[2] Japan Sci & Technol Agcy, Japan & CREST, Kawaguchi, Saitama 3320012, Japan
来源:
SYNCHROTRON RADIATION INSTRUMENTATION, PTS 1 AND 2
|
2007年
/
879卷
关键词:
pinpoint;
nanomaterial;
device;
synchrotron radiation;
femtsecond laser;
pump and probe;
microdiffraction;
D O I:
暂无
中图分类号:
TH7 [仪器、仪表];
学科分类号:
0804 ;
080401 ;
081102 ;
摘要:
The pulse characteristic and high coherent x-ray beam of SPring-8 allow us to investigate dynamics of chemical reactions and phase transition of materials caused by applied field. In order to realize such direct investigation,,,x-ray pinpoint structural measurement", which is the advanced x-ray measurement technique in nanometer spatial scale and/or pico-second time scale, is being developed at SPring-8. The features of "x-ray pinpoint structural measurement" technique are, 1) spatial resolution: similar to 100 mn, 2) time resolution: similar to 40 ps, and 3) measurement under the photo-irradiation, electric field, magnetic field, high pressure and active devices. Using this technique, we will explore the novel concept and new phenomena for nanomaterials and/or devices, and also demonstrate their validity.
引用
收藏
页码:1238 / +
页数:2
相关论文