Layer Number-Dependent Raman Spectra of ?-InSe

被引:16
作者
Sun, Yu-Jia [1 ,2 ]
Pang, Si-Min [1 ,2 ]
Zhang, Jun [1 ,2 ,3 ]
机构
[1] Chinese Acad Sci, Inst Semicond, State Key Lab Superlattices & Microstruct, Beijing 100083, Peoples R China
[2] Univ Chinese Acad Sci, Ctr Mat Sci & Optoelect Engn, Beijing 100049, Peoples R China
[3] Univ Chinese Acad Sci, CAS Ctr Excellence Topol Quantum Computat, Beijing 100049, Peoples R China
基金
国家重点研发计划;
关键词
HIGH-PERFORMANCE; INDIUM SELENIDE; SCATTERING; SHEAR; MULTILAYER; MONOLAYER; MODES;
D O I
10.1021/acs.jpclett.2c00504
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The two-dimensional layered semiconductor InSe, with its high carrier mobility,chemical stability, and strong charge transfer ability, plays a crucial role in optoelectronic devices.The number of InSe layers (L) has an important influence on its band structure andoptoelectronic properties. Herein we present systematic investigations on few-layer (1L-7L)gamma-InSe by optical contrast and Raman spectroscopy. We propose three quantified formulas to quicklyidentify the layer number using optical contrast, the frequency difference of two A1modes, andultralow-frequency Raman spectroscopy, respectively. Moreover, angle-resolved polarizationRaman spectra show that gamma-InSe is isotropic in thea-bplane. Furthermore, using Ramanmapping, wefind that the relative strength of the low-frequency interlayer shear modes isparticularly sensitive to the interaction between the sample and the substrate.
引用
收藏
页码:3691 / 3697
页数:7
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