Effect of helical slow-wave circuit variations on TWT cold-test characteristics

被引:28
作者
Kory, CL [1 ]
Dayton, JA [1 ]
机构
[1] NASA, Lewis Res Ctr, Analex Corp, Cleveland, OH 44135 USA
关键词
dispersion; helix; impedance; manufacturing tolerances; traveling-wave tube;
D O I
10.1109/16.662813
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Recent advances in the state of the art of computer modeling offer the possibility for the first time to evaluate the effect that slow-wave structure parameter variations, such as manufacturing tolerances, have on the cold-test characteristics of helical traveling-wave tubes (TWT's). This will enable manufacturers to determine the cost effectiveness of controlling the dimensions of the component parts of the TWT, which is almost impossible to do experimentally without building a large number of tubes and controlling several parameters simultaneously. The computer code MAFIA is used in this analysis fu determine the effect on dispersion and on-axis interaction impedance of several helical slow-wave circuit parameter variations, including thickness and relative dielectric constant of the support rods, tape width, and height of the metallized films deposited on the dielectric rods, Previous computer analyzes required so many approximations that accurate determinations of the effect of many relevant dimensions on tube performance were practically impossible.
引用
收藏
页码:972 / 976
页数:5
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