Sensitivity analysis of the cross-talk in microstrip transmission lines

被引:0
|
作者
Rajan, VSP [1 ]
Raju, KCJ [1 ]
机构
[1] Univ Hyderabad, Sch Phys, Hyderabad 500046, Andhra Pradesh, India
来源
PROCEEDING OF THE INTERNATIONAL CONFERENCE ON ELECTROMAGNETIC INTERFERENCE AND COMPATIBILITY '99 | 1999年
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中图分类号
O59 [应用物理学];
学科分类号
摘要
This paper concentrates on the phenomena of cross-talk that takes place in the densely packed microstrip transmission line like structures encountered in VLSI systems. A sensitivity analysis is performed for the normalized inter-layer unbalanced cross-talk voltage with respect to all the dimensional parameters on which it depends and the corresponding sensitivity curves plotted Bared on the calculations and resulting figures, conclusions are drawn for minimizing the crosstalk The role of the dielectric constant of the substrate in the cross-talk is also mentioned and the ways to minimize cross-talk are discussed AU lire dimensions are in mils.
引用
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页码:129 / 132
页数:4
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