共 18 条
[1]
INSITU CHARACTERIZATION BY REFLECTANCE DIFFERENCE SPECTROSCOPY OF III-V MATERIALS AND HETEROJUNCTIONS GROWN BY LOW-PRESSURE METAL ORGANIC-CHEMICAL VAPOR-DEPOSITION
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MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY,
1990, 5 (02)
:223-227
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APPLICATION OF REFLECTANCE DIFFERENCE SPECTROSCOPY TO MOLECULAR-BEAM EPITAXY GROWTH OF GAAS AND ALAS
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JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS,
1988, 6 (03)
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[6]
OBSERVATION AND ANALYSIS OF EPITAXIAL-GROWTH WITH REFLECTANCE-DIFFERENCE SPECTROSCOPY
[J].
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY,
1995, 30 (2-3)
:109-119
[8]
ABOVE-BANDGAP OPTICAL ANISOTROPIES IN CUBIC SEMICONDUCTORS - A VISIBLE NEAR ULTRAVIOLET PROBE OF SURFACES
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1985, 3 (05)
:1498-1506