Interpretation of in-plane and out-of-plane anisotropic surface-interface reflectance and transmittance difference spectroscopy

被引:1
作者
Kwok, TK [1 ]
Tam, KC [1 ]
Chu, PK [1 ]
机构
[1] City Univ Hong Kong, Dept Phys & Mat Sci, Hong Kong, Peoples R China
关键词
D O I
10.1364/JOSAB.15.001198
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A numerical method developed previously [J. Appl. Phys. 80, 4621 (1996)] has been extended to simulate the nonnormal-incidence reflectance-difference spectroscopy and transmittance-difference spectroscopy spectra of biaxial anisotropic (epsilon(x) not equal epsilon(y) not equal epsilon(z)) multilayer systems with finite thickness. It is demonstrated that, when the principal axes of the anisotropy layer are at certain orientations, a reflectance-difference spectrum can be separated into two spectra, namely, an in-plane anisotropic spectrum and an out-of-plane anisotropic spectrum. It is shown that the separation is valid for large in-plane anisotropy, i.e., \epsilon(x) - epsilon(y)\ approximate to \epsilon(x)\, and an incident angle of less than or equal to 20 degrees. (C) 1998 Optical Society of America [S0740-3224(98)01203-X].
引用
收藏
页码:1198 / 1204
页数:7
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