Power electronic converter reliability and prognosis review focusing on power switch module failures

被引:40
作者
Abuelnaga, Ahmed [1 ]
Narimani, Mehdi [1 ]
Bahman, Amir Sajjad [2 ]
机构
[1] McMaster Univ, Dept Elect & Comp Engn, Hamilton, ON, Canada
[2] Aalborg Univ, Ctr Reliable Power Elect CORPE, Aalborg, Denmark
基金
加拿大自然科学与工程研究理事会;
关键词
Reliability prediction; Power semiconductor switches; Bond-wire modules; Failure modes; Degradation precursors; Condition monitoring and prognosis; IN-SITU DIAGNOSTICS; IGBT MODULES; DESIGN; DEGRADATION; IMPROVEMENT; MECHANISMS; HUMIDITY; MOSFETS; STRESS; MODEL;
D O I
10.1007/s43236-021-00228-6
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The current trend is to go for more electric systems that rely extensively on power electronics such as EVs/HEVs and electric aircrafts, along with an increased use of renewable energy resources and variable speed motor drives. However, some field failure reports have revealed that power electronic converters represent the weakest point in these systems. A significant percentage of system failures are due to power electronic converter failures, which compromises systems reliability. This raises questions regarding the validity of relying on the current power electronic converter technology to run mission-critical/must-to-be-safe systems. Although power electronic converter technology has reached an advanced level in terms of efficiency, power density, and control, extra work should be done when it comes to reliability. Reliability engineering brings performing failure data analysis, accelerated life testing, lifetime prediction, and the implementation of efficient maintenance and reliability improvement schemes into an integrated process. This process is meant to enhance the reliability of a product throughout its life cycle. This paper provides an overview of the application of the key aspects of new approaches in reliability engineering for power electronic converters. The focus of this paper is on power switch bond-wire modules since they are the most vulnerable component in power electronic converters. This paper also proposes two general schemes for condition-based remaining useful lifetime (RUL) that are discussed in detail.
引用
收藏
页码:865 / 880
页数:16
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