On the performance of SEC and SEC-DED-DAEC codes over burst error channels

被引：1

作者：

Lee, Donggeun ^{[1
]}

Cho, Eunyoung ^{[1
]}

Kim, Sang-Hyo ^{[1
]}

机构：

[1] Sungkyunkwan Univ, Dept Elect & Comp Engn, Suwon, South Korea

来源：

12TH INTERNATIONAL CONFERENCE ON ICT CONVERGENCE (ICTC 2021): BEYOND THE PANDEMIC ERA WITH ICT CONVERGENCE INNOVATION | 2021年

关键词：

dynamic random access memory (DRAM); error correcting codes (ECC); single error correction-double error detection-double adjacent error correction (SEC-DED-DAEC); Gilbert-Elliot channel;

D O I：

10.1109/ICTC52510.2021.9621154

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, we suggest a use of the Gilbert-Elliot (GE) channel model for emulating the burst error characteristics of memory systems such as dynamic random access memory (DRAM). We analyzed the features of the GE channel and obtained experimental results on the error performances of single error correction-double error detection-double adjacent error correction (SEC-DED-DAEC) codes over the GE channel. We confirmed the advantage of SEC-DED-DAEC codes compared with the SEC code over burst error channels.

引用

页码：1898 / 1901

页数：4

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