Single shot femtosecond laser ablation of Copper: Experiment vs. Simulation

被引：1

作者：

Chowdhury, Enam ^{[1
]}

Kafka, Kyle ^{[1
]}

Mitchell, Robert ^{[1
]}

Russell, Alex M. ^{[1
]}

Werner, Kevin ^{[1
]}

Talisa, Noah ^{[1
]}

Li, Hui ^{[2
]}

Yi, Allen ^{[2
]}

Schumacher, Douglass ^{[1
]}

机构：

[1] Ohio State Univ, Dept Phys, Columbus, OH 43210 USA

[2] Ohio State Univ, Dept Integrated Syst Engn, Columbus, OH 43210 USA

来源：

LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 2015 | 2015年 / 9632卷

关键词：

Laser damage; high power laser; short pulse laser; particle in cell; few cycle pulses; laser processing of metals; two temperature model; pair potential; COLLISION MODEL; METALS;

D O I：

10.1117/12.2195787

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Single 5 and 40 femtosecond, near IR pulses with fluences varying from 0.4 - 80 J/cm(2) from a Ti: Sapphire laser was focused onto a single crystal Cu sample surface with 2.0 mu m focal spot at 15 and 45 degree angle of incidence. The surface profiles after interaction were studied with an interferometric depth profiler (Wyko NT9100), and benchmarked against crater size and morphology predicted by 2D Particle-In-Cell (PIC) laser damage simulation model [Mitchell et al. Opt. Eng. 53, 122507 (2014), Opt. Lett. 40, 2189 (2015)].

引用

页数：6

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