Fabrication of fully epitaxial magnetic tunnel junctions with a Co2MnSi thin film and a MgO tunnel barrier

被引:17
作者
Kijima, H. [1 ]
Ishikawa, T. [1 ]
Marukame, T. [1 ]
Matsuda, K.-I. [1 ]
Uemura, T. [1 ]
Yamamoto, M. [1 ]
机构
[1] Hokkaido Univ, Grad Sch Informat Sci & Technol, Div Elect Informat, Kita Ku, Sapporo, Hokkaido 0600814, Japan
关键词
magnetic tunnel junctions; tunnel magnetoresistance; half-metallic ferromagnets; Heusler alloys; Co2MnSi; MgO tunnel barrier;
D O I
10.1016/j.jmmm.2006.10.919
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Fully epitaxial magnetic tunnel junctions (MTJs) were fabricated with a Co-based full-Heusler alloy Co2MnSi (CMS) thin film having the ordered L2(1) structure as a lower electrode, a MgO tunnel barrier, and a Co50Fe50 upper electrode. Reflection high-energy electron diffraction patterns observed in situ for each layer in the MTJ layer structure during fabrication clearly indicated that all layers of the CMS lower electrode, MgO tunnel barrier, and Co50Fe50 upper electrode grew epitaxially. The microfabricated fully epitaxial CMS/MgO/Co50Fe50 MTJs demonstrated relatively high tunnel magnetoresistance ratios of 90% at room temperature and 192% at 4.2 K. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:2006 / 2008
页数:3
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