Modeling and detecting approach for the change point of electronic product infant failure rate

被引：6

作者：

He, Yihai ^{[1
]}

Zhao, Yixiao ^{[1
]}

Wei, Yi ^{[1
]}

Zhang, Anqi ^{[1
]}

Zhou, Di ^{[1
]}

机构：

[1] Beihang Univ, Sch Reliabil & Syst Engn, Beijing 100191, Peoples R China

来源：

MICROELECTRONICS RELIABILITY | 2019年 / 99卷

基金：

中国国家自然科学基金;

关键词：

Infant failure rate; Change point; Statistic index; Weibull shape parameter; CUSUM; WEIBULL SHAPE PARAMETER; CONTROL CHARTS; QUALITY; LIFE;

D O I：

10.1016/j.microrel.2019.06.031

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Infant failures are the natural enemy of customer satisfaction of electronic product. The change point is a precondition to optimize the burn-in time, warranty period, and root causes in production reliability assurance. However, the method for modeling and detecting the change point is unavailable due to the deficient research on the mechanism of infant failure, thereby hindering the continuous optimization of reliability in this field. Therefore, a quantitative method for modeling and detecting the change point of infant failure rate by using the Weibull distribution is proposed in this paper. Firstly, the mechanism of infant failure and the connotation of the change point of infant failure rate are explained. Then a statistic index is proposed to quantitatively model the trend of change point with the non-constant Weibull shape parameter. Also, the proposed statistic index is adopted to detect the trend of change point by CUSUM chart. Finally, an analysis example of a control board is presented to verify the effectiveness of the proposed approach in detecting the changing trend of infant failure rate for electronic products.

引用

页码：222 / 231

页数：10