Characteristics of Iron-Palladium alloy thin films deposited by magnetron sputtering

被引:18
作者
Chiu, Y-J [1 ]
Shen, C-Y [2 ]
Chang, H-W [3 ]
Jian, S-R [4 ]
机构
[1] Xiamen Univ Technol, Sch Mech & Automot Engn, 600 Ligong Rd, Xiamen 361024, Fujian, Peoples R China
[2] Hsiuping Univ Sci & Technol, Dept Elect Engn, Taichung 412, Taiwan
[3] Natl Chung Cheng Univ, Dept Phys, Chiayi 621, Taiwan
[4] I Shou Univ, Dept Mat Sci & Engn, Kaohsiung 840, Taiwan
关键词
FePd alloy thin films; Nanoindentation; Magnetic properties; Surface energy; NANOINDENTATION; TRANSITION; SILICON; ZNSE;
D O I
10.1016/j.rinp.2018.02.024
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The microstructural features, magnetic, nanomechanical properties and wettability behaviors of Iron-Palladium (FePd) alloy thin films are investigated by using X-ray diffraction (XRD), atomic force microscopy (AFM), vibrating sample magnetometer (VSM), nanoindentation and water contact angle (CA) techniques, respectively. The FePd alloy thin films were deposited on glass substrates using a magnetron sputtering system. The post-annealing processes of FePd alloy thin films were carried out at 400 degrees C and 750 degrees C and resulted in a significant increase of both the average grain size and surface roughness. The XRD analysis showed that FePd alloy thin films exhibited a predominant (111) orientation. The magnetic field dependence of magnetization of all FePd thin films are measured at room temperature showed the ferromagnetic characteristics. The nanoindentation with continuous stiffness measurement (CSM) is used to measure the hardness and Young's modulus of present films. The contact angle (hCA) increased with increasing surface roughness. The maximum theta(C Lambda) of 75 degrees was achieved for the FePd alloy thin film after annealing at 750 degrees C and a surface roughness of 4.2 nm. (C) 2018 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND license.
引用
收藏
页码:17 / 22
页数:6
相关论文
共 42 条
[1]   Effect of native oxide mechanical deformation on InP nanoindentation [J].
Almeida, C. M. ;
Prioli, R. ;
Ponce, F. A. .
JOURNAL OF APPLIED PHYSICS, 2008, 104 (11)
[2]   Contact wetting angle as a characterization technique for processing CdTe/CdS solar cells [J].
Angelo, M. S. ;
McCandless, B. E. ;
Birkmire, R. W. ;
Rykov, S. A. ;
Chen, J. G. .
PROGRESS IN PHOTOVOLTAICS, 2007, 15 (02) :93-111
[3]   Catalyst-Free Synthesis and Structural and Mechanical Characterization of Single Crystalline Ca2B2O5•H2O Nanobelts and Stacking Faulted Ca2B2O5 Nanogrooves [J].
Bao, Lihong ;
Xu, Zhi-Hui ;
Li, Rui ;
Li, Xiaodong .
NANO LETTERS, 2010, 10 (01) :255-262
[4]   Modification of Properties of Yttria Stabilized Zirconia Epitaxial Thin Films by Excimer Laser Annealing [J].
Bayati, R. ;
Molaeil, R. ;
Richmond, A. ;
Nori, S. ;
Wu, F. ;
Kumar, D. ;
Narayan, J. ;
Reynolds, J. G. ;
Reynolds, C. L., Jr. .
ACS APPLIED MATERIALS & INTERFACES, 2014, 6 (24) :22316-22325
[5]   Effect of roughness on the measurement of nanohardness - a computer simulation study [J].
Bobji, MS ;
Biswas, SK ;
Pethica, JB .
APPLIED PHYSICS LETTERS, 1997, 71 (08) :1059-1061
[6]   Growth and structural and magnetic characterization of the FePd ordered alloy on CdZnTeII-VI semiconductor [J].
Bourgognon, C ;
Tatarenko, S ;
Cibert, J ;
Gilles, B ;
Marty, A ;
Samson, Y .
APPLIED PHYSICS LETTERS, 1999, 75 (18) :2818-2820
[7]   Chemical ordering of epitaxial FePd deposited on ZnSe and the surfactant effect of segregated Se [J].
Bourgognon, C ;
Tatarenko, S ;
Cibert, J ;
Carbonell, L ;
Etgens, VH ;
Eddrief, M ;
Gilles, B ;
Marty, A ;
Samson, Y .
APPLIED PHYSICS LETTERS, 2000, 76 (11) :1455-1457
[8]   The influence of the Pt buffer layer on the perpendicular magnetic anisotropy in epitaxial FePd(001) ordered alloys grown by sputtering [J].
Caro, P ;
Cebollada, A ;
Ravelosona, D ;
Briones, F ;
Garcia, D ;
Vazquez, M ;
Hernando, A .
JOURNAL OF APPLIED PHYSICS, 1997, 81 (08) :5050-5052
[9]  
Cullity B.D., 2001, ELEMENTS OFX RAY DIF, P170
[10]   Electrochromic performance, wettability and optical study of copper manganese oxide thin films: Effect of annealing temperature [J].
Falahatgar, S. S. ;
Ghodsi, F. E. ;
Tepehan, F. Z. ;
Tepehan, G. G. ;
Turhan, I. .
APPLIED SURFACE SCIENCE, 2014, 289 :289-299