Near-field microwave diagnostics with nonlinear-optical sensors

被引：0
|
作者：
Whitaker, John F. [1 ,2 ,3 ]
Yang, Kyoung [3 ]
Chen, Chia-Chu [1 ,2 ]
机构：
[1] Univ Michigan, Ctr Ultrafast Opt Sci, 2200 Bonisteel Blvd,Rm 1006, Ann Arbor, MI 48109 USA
[2] Univ Michigan, Dept Elect Engn & Comp Sci, Ann Arbor, MI 48109 USA
[3] Opteos Inc, Ann Arbor, MI 48108 USA
来源：
ULTRAFAST PHENOMENA IN SEMICONDUCTORS AND NANOSTRUCTURE MATERIALS XI AND SEMICONDUCTOR PHOTODETECTORS IV | 2007年 / 6471卷
关键词：
microwave field-mapping; electro-optic sensing; magneto-optic sensing; near-field diagnostics; microwave photonics; diluted magnetic semiconductors;
D O I：
10.1117/12.707781
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
The concept and implementation of a near-field microwave measurement system that relies on the Pockels effect in fiber-coupled, semi-insulating GaAs probes to acquire polarization-sensitive maps of electric-field patterns in close proximity to antenna arrays, integrated circuits, and packaged components, is presented. The evolution of the electro-optic field-mapping technique, which has subsequently addressed magnetic-field characterization via magneto-optic sensing and temperature measurement through semiconductor band-gap modulation, will also be discussed. The use of emerging materials, such as diluted magnetic semiconductors, is also considered.
引用
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页数：9
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