Interphase boundaries in engineering ceramics

被引：0

作者：

Knowles, KM ^{[1
]}

机构：

[1] Univ Cambridge, Dept Mat Sci & Met, Cambridge CB2 3QZ, England

来源：

JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS | 2000年 / 2卷 / 05期

关键词：

engineering ceramics; interfaces; amorphous thin films; high-resolution transmission electron microscopy;

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Interphase boundaries in engineering ceramics invariably contain thin intergranular films arising from the method of manufacture. Experimental evidence and theoretical understanding of these films is presented and discussed, with particular attention paid to circumstances where such films are not seen. In addition, evidence for and against the development of preferred orientation relationships and good lattice matching at intergranular and interphase boundaries is presented and discussed. This is relevant when developing models for the strength and toughness of engineering ceramics, and it can also be a reason for the absence of intergranular films.

引用

页码：542 / 551

页数：10

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