Non-destructive PCB Reverse Engineering Using X-ray Micro Computed Tomography

被引:0
|
作者
Asadizanjani, Navid [1 ]
Shahbazmohamadi, Sina [2 ]
Tehranipoor, Mark [1 ]
Forte, Domenic [1 ]
机构
[1] Univ Florida, Elect & Comp Engn Dept, Gainesville, FL 32611 USA
[2] Manhattan Coll, Dept Mech Engn, Bronx, NY 10471 USA
关键词
Printed circuit boards; non-destructive imaging; X-ray tomography; reverse engineering;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Reverse engineering of electronics systems is performed for various reasons ranging from honest ones such as failure analysis, fault isolation, trustworthiness verification, obsolescence management, etc. to dishonest ones such as cloning, counterfeiting, identification of vulnerabilities, development of attacks, etc. Regardless of the goal, it is imperative that the research community understands the requirements, complexities, and limitations of reverse engineering. Until recently, the reverse "engineering was considered as destructive, time consuming, and prohibitively expensive, thereby restricting its application to a few remote cases. However, the advents of advanced characterization and imaging tools and software have counteracted this point of view. In this paper, we show how X-ray micro-tomography imaging can be combined with advanced 3D image processing and analysis to facilitate the automation of reverse engineering, and thereby lowering the associated time and cost. In this paper, we demonstrate our proposed process on two different printed circuit boards (PCBs). The first PCB is a four-layer custom designed board while the latter is a more complex commercial system. Lessons learned from this effort can be used to both develop advanced countermeasures and establish a more efficient workflow for instances where reverse engineering is deemed necessary.
引用
收藏
页码:164 / 172
页数:9
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