Nanoscale chemical and materials characterization with near-field microscopy and spectroscopy.

被引：0
|
作者：
Stranick, SJ
机构：
[1] NIST, CSTL, Gaithersburg, MD 20899 USA
[2] DuPont Co Inc, Expt Stn Res, Wilmington, DE 19898 USA
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 2004年 / 227卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
33-PHYS
引用
收藏
页码：U250 / U250
页数：1
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