Analysis of dissolution kinetics of narrow polydispersity poly(4-hydroxystyrene) in alkaline aqueous solution using machine learning

被引:12
作者
Tanaka, Naoki [1 ]
Watanabe, Kyoko [1 ]
Matsuoka, Kyoko [1 ]
Azumagawa, Kazuki [1 ]
Kozawa, Takahiro [1 ]
Ikeda, Takuya [2 ]
Komuro, Yoshitaka [2 ]
Kawana, Daisuke [2 ]
机构
[1] Osaka Univ, Inst Sci & Ind Res, Ibaraki, Osaka 5670047, Japan
[2] Tokyo Ohka Kogyo Co Ltd, Samukawa, Kanagawa 2530114, Japan
关键词
EUV lithography; chemically amplified resist; development; rinsing; machine learning; swelling; CASE-II DIFFUSION; RESIST; POLYMERS;
D O I
10.35848/1347-4065/ac016d
中图分类号
O59 [应用物理学];
学科分类号
摘要
Understanding the dissolution kinetics of resist materials is essential for their efficient development. In this study, we investigated the dissolution kinetics of poly(4-hydroxystyrene) (PHS) with a weight-average molecular weight (M (w)) of 8000-30 000 and a polydispersity index (M (w) /M (n)) of 1.07-1.20. The dissolution kinetics of PHS films was observed in tetramethylammonium hydroxide (TMAH) aqueous developers by a quartz crystal microbalance (QCM) method. The TMAH concentration was changed from 0 to 2.38 wt%. The formation of a thick transient swelling layer at these M (w) /M (n) values was suppressed compared with that at M (w) /M (n) > 2. QCM data were analyzed using the polynomial regression to clarify the effects of M (w) and M (w) /M (n) on the dissolution kinetics in a narrow polydispersity region. Both dissolving and swelling kinetics largely depended on M (w)/M (n). M (w) had little effect in 2.38 wt% TMAH developer; however, it had a large effect on the swelling when 2.38 wt% TMAH developer was diluted.
引用
收藏
页数:9
相关论文
共 33 条
[1]   Polymer Informatics: Opportunities and Challenges [J].
Audus, Debra J. ;
de Pablo, Juan J. .
ACS MACRO LETTERS, 2017, 6 (10) :1078-1082
[2]   Application of machine learning to stochastic effect analysis of chemically amplified resists used for extreme ultraviolet lithography [J].
Azumagawa, Kazuki ;
Kozawa, Takahiro .
JAPANESE JOURNAL OF APPLIED PHYSICS, 2021, 60 (SC)
[3]   Regression analysis of photodecomposable quencher concentration effects on chemical gradient in chemically amplified extreme ultraviolet resist processes [J].
Azumagawa, Kazuki ;
Kozawa, Takahiro .
JAPANESE JOURNAL OF APPLIED PHYSICS, 2020, 59 (11)
[4]   PHOTOCHEMISTRY OF TRIARYLSULFONIUM SALTS [J].
DEKTAR, JL ;
HACKER, NP .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1990, 112 (16) :6004-6015
[5]   Top coat less resist process development for contact layer of 40nm node logic devices [J].
Fujita, Masafumi ;
Uchiyama, Takayuki ;
Furusho, Tetsunari ;
Otsuka, Takahisa ;
Tsuchiya, Katsuhiro .
ADVANCES IN RESIST MATERIALS AND PROCESSING TECHNOLOGY XXVII, PTS 1 AND 2, 2010, 7639
[6]   In situ study of hydrogen silsesquioxane dissolution rate in salty and electrochemical developers [J].
Harry, Katherine J. ;
Strobel, Sebastian ;
Yang, Joel K. W. ;
Duan, Huigao ;
Berggren, Karl K. .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2011, 29 (06)
[7]   Newly developed alternating-copolymer-based silicon containing resists for sub-100nm pattern fabrication [J].
Hatakeyama, J ;
Takeda, T ;
Kinsho, T ;
Kawai, Y ;
Ishihara, T .
ADVANCES IN RESIST TECHNOLOGY AND PROCESSING XX, PTS 1 AND 2, 2003, 5039 :672-681
[8]   Characterization of reactive dissolution and swelling of polymer films using a quartz crystal microbalance and visible and infrared reflectance spectroscopy [J].
Hinsberg, W ;
Houle, FA ;
Lee, SW ;
Ito, H ;
Kanazawa, K .
MACROMOLECULES, 2005, 38 (05) :1882-1898
[9]   MEASUREMENT OF THIN-FILM DISSOLUTION KINETICS USING A QUARTZ CRYSTAL MICROBALANCE [J].
HINSBERG, WD ;
WILLSON, CG ;
KANAZAWA, KK .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1986, 133 (07) :1448-1451
[10]   CASE-II DIFFUSION IN POLYMERS .2. STEADY-STATE FRONT MOTION [J].
HUI, CY ;
WU, KC ;
LASKY, RC ;
KRAMER, EJ .
JOURNAL OF APPLIED PHYSICS, 1987, 61 (11) :5137-5149