Process control and pulsed laser deposition of materials

被引:0
|
作者
Biggers, R [1 ]
Kozlowski, G [1 ]
Jones, J [1 ]
Dempsey, D [1 ]
Kleismit, R [1 ]
Maartense, I [1 ]
Busbee, J [1 ]
Peterson, T [1 ]
Perrin, R [1 ]
机构
[1] USAF, Res Lab, Wright Patterson AFB, OH 45433 USA
关键词
process control; pulsed laser deposition; emission sensor; superconductor; ferroelectric;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Pulsed-laser deposition (PLD) is a very powerful and rapid deposition technique, which can produce exceptional-quality thin films. Although PLD has tremendous versatility and potential, PLD capabilities are still constrained by a lack of process control. At the Air Force Research Laboratory on-site at Wright-Patterson AFB, we are developing in-situ/real-time control methodologies for PLD and other thin-film deposition processes. We have identified appropriate sensors for closed-loop feedback control and utilized them with YBa2Cu3O7-x, (YBCO) to identify critical process control parameters. Control instrumentation has recently been improved by the addition of moveable fixed-position plume-emission sensors. The reproducibility of YBCO film quality increased significantly when process control was applied to PLD processing. PLD process control techniques were applied during simulated and actual BSTO depositions. A comparison of deposition control with the controlling sensor at different distances from the substrate heater position is discussed. Further process refinement using Lime-resolved spectral components of the PLD plume on subsequent film quality is also discussed.
引用
收藏
页码:201 / 211
页数:11
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