Fast first-order perturbation approach to the surface structural problem using low energy electron diffraction

被引：1
|
作者：
Cerda, J [1 ]
Gallego, S [1 ]
deAndres, PL [1 ]
机构：
[1] CSIC,INST CIENCIA MAT,E-28049 CANTO BLANCO,MADRID,SPAIN
来源：
SURFACE SCIENCE | 1996年 / 348卷 / 1-2期
关键词：
electron-solid interactions; scattering; diffraction; low energy electron diffraction (LEED); surface structure;
D O I：
10.1016/0039-6028(95)01031-9
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
We use first-order renormalized forward scattering coupled to a simulated annealing optimization algorithm to get the unknown structural parameters of a surface over a wide range of different possibilities. The method is very fast and provides in an automated manner a quasi-global solution ready to be further refined using other techniques.
引用
收藏
页码：197 / 208
页数：12
相关论文
共 50 条
  • [31] Low-energy electron diffraction patterns using field-emitted electrons from tungsten tips
    Mizuno, S
    Rahman, F
    Iwanaga, M
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 2006, 45 (4-7): : L178 - L179
  • [32] Structural Analysis of Crystal Surfaces by Reflection High-Energy Electron Diffraction Patterns: The Si(111)7 x 7 Surface
    Minami, Tomoko
    Yamagata, Yuki
    Nakahara, Hitoshi
    Ichimiya, Ayahiko
    E-JOURNAL OF SURFACE SCIENCE AND NANOTECHNOLOGY, 2008, 6 : 87 - 90
  • [33] Surface structure of N/Pd(100)-c(2x2) determined by tensor low energy electron diffraction analysis
    Kayama, T
    Hamamatsu, H
    Yokoyama, T
    Ohta, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1998, 37 (10): : 5697 - 5700
  • [34] OBSERVATION OF INITIAL GROWTH STAGE OF AMORPHOUS SI FILM DEPOSITED ON 7X7 SUPERLATTICE SURFACE OF SI(111) BY LOW-ENERGY ELECTRON-DIFFRACTION
    SHIGETA, Y
    MAKI, K
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1990, 29 (10): : 2092 - 2097
  • [35] 1D chain formation by coadsorption of Pb and Bi on Cu(001): Determination using low energy electron diffraction
    Kabiruzzaman, Md
    Ahmed, Rezwan
    Nakagawa, Takeshi
    Mizuno, Seigi
    SURFACE SCIENCE, 2017, 664 : 70 - 75
  • [36] High-resolution Si 2p core-level and low-energy electron diffraction studies of the Ca/Si(111)-(3 x 2) surface
    Sakamoto, K
    Takeyama, W
    Zhang, HM
    Uhrberg, RIG
    SURFACE SCIENCE, 2003, 532 : 628 - 632
  • [37] Fully performed constant-momentum-transfer-averaging in low-energy electron diffraction demonstrated for a single-domain Si(111) 4x1-In surface
    Abukawa, Tadashi
    Yamazaki, Tomoyuki
    Kono, Shozo
    E-JOURNAL OF SURFACE SCIENCE AND NANOTECHNOLOGY, 2006, 4 : 661 - 668
  • [38] Tensor low-energy electron diffraction analysis of the surface structure of NaCl(100) thin films grown on Pd(100) and Pt(111)
    Roberts, JG
    Hoffer, S
    Van Hove, MA
    Somorjai, GA
    SURFACE SCIENCE, 1999, 437 (1-2) : 75 - 85
  • [39] Surface structural analysis of SrF2(111) using low-energy atom scattering spectroscopy
    Fukuta H.
    Tan G.
    Oga T.
    Matsuda A.
    Yoshimoto M.
    Matsuura H.
    Umezawa K.
    Japanese Journal of Applied Physics, 2024, 63 (02)
  • [40] Surface structure of In2O3(111) (1 x 1) determined by density functional theory calculations and low energy electron diffraction
    Pussi, K.
    Matilainen, A.
    Dhanak, V. R.
    Walsh, A.
    Egdell, R. G.
    Zhang, K. H. L.
    SURFACE SCIENCE, 2012, 606 (1-2) : 1 - 6
12345