Image force microscopy of molecular resonance: A microscope principle

被引:134
作者
Rajapaksa, I. [1 ]
Uenal, K. [1 ]
Wickramasinghe, H. Kumar [1 ]
机构
[1] Univ Calif Irvine, Dept Elect Engn & Comp Sci, Irvine, CA 92697 USA
关键词
atomic force microscopy; scanning probe microscopy; RESOLUTION;
D O I
10.1063/1.3480608
中图分类号
O59 [应用物理学];
学科分类号
摘要
We demonstrate a technique in microscopy which extends the domain of atomic force microscopy to optical spectroscopy at the nanometer scale. We show that molecular resonance of feature sizes down to the single molecular level can be detected and imaged purely by mechanical detection of the force gradient between the interaction of the optically driven molecular dipole and its mirror image in a platinum coated scanning probe tip. This microscopy and spectroscopy technique is extendable to frequencies ranging from radio to infrared and the ultraviolet. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3480608]
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页数:3
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