Graphene exhibits outstanding fluorescence quenching properties that can become useful for biophysics and biosensing applications, but it remains challenging to harness these advantages due to the complex transfer procedure of chemical vapor deposition-grown graphene to glass coverslips and the low yield of usable samples. Here, we screen 10 graphene-on-glass preparation methods and present an optimized protocol. To obtain the required quality for single-molecule and super-resolution imaging on graphene, we introduce a graphene screening method that avoids consuming the investigated sample. We apply DNA origami nanostructures to place fluorescent probes at a defined distance on top of graphene-on-glass coverslips. Subsequent fluorescence lifetime imaging directly reports on the graphene quality, as deviations from the expected fluorescence lifetime indicate imperfections. We compare the DNA origami probes with conventional techniques for graphene characterization, including light microscopy, atomic force microscopy, and Raman spectroscopy. For the latter, we observe a discrepancy between the graphene quality implied by Raman spectra in comparison to the quality probed by fluorescence lifetime quenching measured at the same position. We attribute this discrepancy to the difference in the effective area that is probed by Raman spectroscopy and fluorescence quenching. Moreover, we demonstrate the applicability of already screened and positively evaluated graphene for studying single-molecule conformational dynamics on a second DNA origami structure. Our results constitute the basis for graphene-based biophysics and super-resolution microscopy.
机构:
Univ Ulm, Cent Facil Electron Microscopy, Grp Electron Microscopy Mat Sci, D-89081 Ulm, Germany
Tech Univ Ilmenau, Dept Chem, D-98693 Ilmenau, GermanyUniv Ulm, Cent Facil Electron Microscopy, Grp Electron Microscopy Mat Sci, D-89081 Ulm, Germany
Algara-Siller, Gerardo
;
Lehtinen, Ossi
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机构:
Univ Ulm, Cent Facil Electron Microscopy, Grp Electron Microscopy Mat Sci, D-89081 Ulm, GermanyUniv Ulm, Cent Facil Electron Microscopy, Grp Electron Microscopy Mat Sci, D-89081 Ulm, Germany
Lehtinen, Ossi
;
Turchanin, Andrey
论文数: 0引用数: 0
h-index: 0
机构:
Univ Bielefeld, Fac Phys, D-33615 Bielefeld, GermanyUniv Ulm, Cent Facil Electron Microscopy, Grp Electron Microscopy Mat Sci, D-89081 Ulm, Germany
Turchanin, Andrey
;
Kaiser, Ute
论文数: 0引用数: 0
h-index: 0
机构:
Univ Ulm, Cent Facil Electron Microscopy, Grp Electron Microscopy Mat Sci, D-89081 Ulm, GermanyUniv Ulm, Cent Facil Electron Microscopy, Grp Electron Microscopy Mat Sci, D-89081 Ulm, Germany
机构:
Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Metrol Mat, BR-25250020 Rio De Janeiro, BrazilUniv Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil
Martins Ferreira, E. H.
;
Stavale, F.
论文数: 0引用数: 0
h-index: 0
机构:
Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Metrol Mat, BR-25250020 Rio De Janeiro, BrazilUniv Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil
Stavale, F.
;
Achete, C. A.
论文数: 0引用数: 0
h-index: 0
机构:
Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Metrol Mat, BR-25250020 Rio De Janeiro, BrazilUniv Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil
Achete, C. A.
;
Capaz, R. B.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Fed Rio de Janeiro, Inst Fis, BR-21941972 Rio De Janeiro, BrazilUniv Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil
Capaz, R. B.
;
Moutinho, M. V. O.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Fed Rio de Janeiro, Inst Fis, BR-21941972 Rio De Janeiro, BrazilUniv Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil
机构:
Purdue Univ, Dept Phys, W Lafayette, IN 47907 USA
Purdue Univ, Birck Nanotechnol Ctr, W Lafayette, IN 47907 USAPurdue Univ, Dept Phys, W Lafayette, IN 47907 USA
Childres, Isaac
;
Jauregui, Luis A.
论文数: 0引用数: 0
h-index: 0
机构:
Purdue Univ, Birck Nanotechnol Ctr, W Lafayette, IN 47907 USA
Purdue Univ, Sch Elect & Comp Engn, W Lafayette, IN 47907 USAPurdue Univ, Dept Phys, W Lafayette, IN 47907 USA
Jauregui, Luis A.
;
Tian, Jifa
论文数: 0引用数: 0
h-index: 0
机构:
Purdue Univ, Dept Phys, W Lafayette, IN 47907 USA
Purdue Univ, Birck Nanotechnol Ctr, W Lafayette, IN 47907 USAPurdue Univ, Dept Phys, W Lafayette, IN 47907 USA
Tian, Jifa
;
Chen, Yong P.
论文数: 0引用数: 0
h-index: 0
机构:
Purdue Univ, Dept Phys, W Lafayette, IN 47907 USA
Purdue Univ, Birck Nanotechnol Ctr, W Lafayette, IN 47907 USA
Purdue Univ, Sch Elect & Comp Engn, W Lafayette, IN 47907 USAPurdue Univ, Dept Phys, W Lafayette, IN 47907 USA
机构:
Univ Ulm, Cent Facil Electron Microscopy, Grp Electron Microscopy Mat Sci, D-89081 Ulm, Germany
Tech Univ Ilmenau, Dept Chem, D-98693 Ilmenau, GermanyUniv Ulm, Cent Facil Electron Microscopy, Grp Electron Microscopy Mat Sci, D-89081 Ulm, Germany
Algara-Siller, Gerardo
;
Lehtinen, Ossi
论文数: 0引用数: 0
h-index: 0
机构:
Univ Ulm, Cent Facil Electron Microscopy, Grp Electron Microscopy Mat Sci, D-89081 Ulm, GermanyUniv Ulm, Cent Facil Electron Microscopy, Grp Electron Microscopy Mat Sci, D-89081 Ulm, Germany
Lehtinen, Ossi
;
Turchanin, Andrey
论文数: 0引用数: 0
h-index: 0
机构:
Univ Bielefeld, Fac Phys, D-33615 Bielefeld, GermanyUniv Ulm, Cent Facil Electron Microscopy, Grp Electron Microscopy Mat Sci, D-89081 Ulm, Germany
Turchanin, Andrey
;
Kaiser, Ute
论文数: 0引用数: 0
h-index: 0
机构:
Univ Ulm, Cent Facil Electron Microscopy, Grp Electron Microscopy Mat Sci, D-89081 Ulm, GermanyUniv Ulm, Cent Facil Electron Microscopy, Grp Electron Microscopy Mat Sci, D-89081 Ulm, Germany
机构:
Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Metrol Mat, BR-25250020 Rio De Janeiro, BrazilUniv Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil
Martins Ferreira, E. H.
;
Stavale, F.
论文数: 0引用数: 0
h-index: 0
机构:
Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Metrol Mat, BR-25250020 Rio De Janeiro, BrazilUniv Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil
Stavale, F.
;
Achete, C. A.
论文数: 0引用数: 0
h-index: 0
机构:
Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Metrol Mat, BR-25250020 Rio De Janeiro, BrazilUniv Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil
Achete, C. A.
;
Capaz, R. B.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Fed Rio de Janeiro, Inst Fis, BR-21941972 Rio De Janeiro, BrazilUniv Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil
Capaz, R. B.
;
Moutinho, M. V. O.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Fed Rio de Janeiro, Inst Fis, BR-21941972 Rio De Janeiro, BrazilUniv Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil
机构:
Purdue Univ, Dept Phys, W Lafayette, IN 47907 USA
Purdue Univ, Birck Nanotechnol Ctr, W Lafayette, IN 47907 USAPurdue Univ, Dept Phys, W Lafayette, IN 47907 USA
Childres, Isaac
;
Jauregui, Luis A.
论文数: 0引用数: 0
h-index: 0
机构:
Purdue Univ, Birck Nanotechnol Ctr, W Lafayette, IN 47907 USA
Purdue Univ, Sch Elect & Comp Engn, W Lafayette, IN 47907 USAPurdue Univ, Dept Phys, W Lafayette, IN 47907 USA
Jauregui, Luis A.
;
Tian, Jifa
论文数: 0引用数: 0
h-index: 0
机构:
Purdue Univ, Dept Phys, W Lafayette, IN 47907 USA
Purdue Univ, Birck Nanotechnol Ctr, W Lafayette, IN 47907 USAPurdue Univ, Dept Phys, W Lafayette, IN 47907 USA
Tian, Jifa
;
Chen, Yong P.
论文数: 0引用数: 0
h-index: 0
机构:
Purdue Univ, Dept Phys, W Lafayette, IN 47907 USA
Purdue Univ, Birck Nanotechnol Ctr, W Lafayette, IN 47907 USA
Purdue Univ, Sch Elect & Comp Engn, W Lafayette, IN 47907 USAPurdue Univ, Dept Phys, W Lafayette, IN 47907 USA