ZnO/BaFe12O19 composite thick films with four different ZnO/BaFe12O19 mass fractions were synthesized with the tape-casting method in the presence of plate-like BaFe12O19 grains and sphere-like ZnO grains. Their phase composition, morphology and magnetic properties were analyzed by means of XRD, SEM and VSM, respectively. The microwave absorption properties were also investigated in the frequency range of 2-18 GHz, and the results show that the ZnO/BaFe12O19 composite thick films have multiple microwave attenuation peaks and their microwave absorption properties can be easily tuned by varying the mass ratio of BaFe12O19/ZnO. When the mass ratio of BaFe12O19 to ZnO is 15:85, the composite thick film exhibits a minimum RL of -48.6 dB at 17.2 GHz with a thickness of 4.5 mm. The electromagnetic performance of the ZnO/BaFe12O19 composite thick films could be attributed to the effective complementarities between the dielectric loss and the magnetic loss.
机构:
Ctr Tecnol Recursos Minerales & Ceram CETMIC, RA-1897 Manuel B Gonnet, Buenos Aires, ArgentinaCtr Tecnol Recursos Minerales & Ceram CETMIC, RA-1897 Manuel B Gonnet, Buenos Aires, Argentina
Albano, MP
Garrido, LB
论文数: 0引用数: 0
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机构:
Ctr Tecnol Recursos Minerales & Ceram CETMIC, RA-1897 Manuel B Gonnet, Buenos Aires, ArgentinaCtr Tecnol Recursos Minerales & Ceram CETMIC, RA-1897 Manuel B Gonnet, Buenos Aires, Argentina
Garrido, LB
[J].
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING,
2006,
420
(1-2):
: 171
-
178
机构:
Ctr Tecnol Recursos Minerales & Ceram CETMIC, RA-1897 Manuel B Gonnet, Buenos Aires, ArgentinaCtr Tecnol Recursos Minerales & Ceram CETMIC, RA-1897 Manuel B Gonnet, Buenos Aires, Argentina
Albano, MP
Garrido, LB
论文数: 0引用数: 0
h-index: 0
机构:
Ctr Tecnol Recursos Minerales & Ceram CETMIC, RA-1897 Manuel B Gonnet, Buenos Aires, ArgentinaCtr Tecnol Recursos Minerales & Ceram CETMIC, RA-1897 Manuel B Gonnet, Buenos Aires, Argentina
Garrido, LB
[J].
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING,
2006,
420
(1-2):
: 171
-
178